Band structure ofAI/Si/n-type GaAs with a strained Si interfacial layer

1996 ◽  
Vol 53 (7) ◽  
pp. 3879-3884 ◽  
Author(s):  
Z. Chen ◽  
S. N. Mohammad ◽  
H. Morkoç
2010 ◽  
Vol 663-665 ◽  
pp. 470-472 ◽  
Author(s):  
Jian Jun Song ◽  
He Ming Zhang ◽  
Hui Yong Hu ◽  
Xian Ying Dai ◽  
Rong Xi Xuan

The intrinsic carrier concentration is the important parameter for researching strained Si1-xGex materials properties and evaluating Si-based strained devices parameters. In this paper, at the beginning of analyzing the band structure of strained Si1-xGex/(101)Si, the dependence of its effective densities of states for the conduction and valence bands (Nc, Nv) and its intrinsic carrier concentration (ni) on Ge fraction (x) and temperature were obtained. The results show that ni increases significantly due to the effect of strain in strained Si1-xGex/(101)Si. Furthermore, Nc and Nv decrease with increasing Ge fraction (x). In addition, it is also found that as the temperature becomes higher, the increase in Nc and Nv occurs. The results can provide valuable references to the understanding on the Si-based strained device physics and its design.


2008 ◽  
Vol 57 (9) ◽  
pp. 5918
Author(s):  
Song Jian-Jun ◽  
Zhang He-Ming ◽  
Dai Xian-Ying ◽  
Hu Hui-Yong ◽  
Xuan Rong-Xi

2011 ◽  
Vol 44 (32) ◽  
pp. 325107 ◽  
Author(s):  
Feng Chen ◽  
Chanan Euaruksakul ◽  
Zheng Liu ◽  
F J Himpsel ◽  
Feng Liu ◽  
...  

2009 ◽  
Vol 52 (4) ◽  
pp. 546-550 ◽  
Author(s):  
JianJun Song ◽  
HeMing Zhang ◽  
HuiYong Hu ◽  
Qiang Fu
Keyword(s):  

2004 ◽  
Vol 51 (6) ◽  
pp. 962-970 ◽  
Author(s):  
X.-F. Fan ◽  
X. Wang ◽  
B. Winstead ◽  
L.F. Register ◽  
U. Ravaioli ◽  
...  

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