Phase separation and step roughening of vicinal Si(111): An x-ray-scattering study

1995 ◽  
Vol 51 (11) ◽  
pp. 7269-7278 ◽  
Author(s):  
G. A. Held ◽  
D. M. Goodstein ◽  
J. D. Brock
1972 ◽  
Vol 43 (4) ◽  
pp. 1636-1641 ◽  
Author(s):  
I. S. Patel ◽  
Paul W. Schmidt ◽  
Stanley M. Ohlberg

Author(s):  
Panteleimon Panagiotou ◽  
Estelle Bauer ◽  
Simona Loi ◽  
Tobias Titz ◽  
Edith Maurer ◽  
...  

AbstractX-ray scattering based on synchrotron radiation enables the detection of polymeric structures at interfaces despite the weak contrast between adjacent polymers build-up from different monomeric units. Variable types of polymeric structures result from typical pattern directing mechanisms, such as dewetting in case of homopolymer films, phase separation in polymer blend films, micro-phase separation in diblock copolymer films and surface enrichment in statistical copolymer films. The pattern directing mechanisms introduce structures ordered perpendicular and parallel to the polymeric surface. Consequently, specular and off-specular X-ray scattering is applied as demonstrated within examples. From scattering the characteristic structures which are not accessible by means of other techniques are determined. Limitations with respect to isolated objects such as holes are discussed.


1999 ◽  
Vol 59 (18) ◽  
pp. 11755-11759 ◽  
Author(s):  
W. Liu ◽  
W. L. Johnson ◽  
S. Schneider ◽  
U. Geyer ◽  
P. Thiyagarajan

1991 ◽  
Vol 43 (16) ◽  
pp. 13417-13437 ◽  
Author(s):  
G. Brian Stephenson ◽  
William K. Warburton ◽  
Wolfgang Haller ◽  
Arthur Bienenstock

1996 ◽  
Vol 6 (8) ◽  
pp. 1085-1094 ◽  
Author(s):  
A. Gibaud ◽  
J. Wang ◽  
M. Tolan ◽  
G. Vignaud ◽  
S. K. Sinha

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