Composition and thermal-annealing-induced short-range ordering changes in amorphous hydrogenated silicon carbide films as investigated by extended x-ray-absorption fine structure and infrared absorption

1995 ◽  
Vol 51 (8) ◽  
pp. 4903-4914 ◽  
Author(s):  
M. A. El Khakani ◽  
D. Guay ◽  
M. Chaker ◽  
X. H. Feng
Keyword(s):  
Silicon Carbide ◽  
Fine Structure ◽  
Thermal Annealing ◽  
Infrared Absorption ◽  
Short Range ◽  
Hydrogenated Silicon ◽  
X Ray ◽  
Amorphous Hydrogenated Silicon ◽  
Short Range Ordering ◽  
X Ray Absorption

Short Range Order Strucrures in Y-Pr-Ba-Cu-O System Studied by X-Ray Absorption Fine Structure (XAFS) Techniques

1990 ◽  
Vol 209 ◽  
Author(s):  
Y.H. Kao ◽  
A. Krol ◽  
Z.H. Ming ◽  
C.S. Lin ◽  
Y.L. Soo ◽  
...  
Keyword(s):  
Fine Structure ◽  
Local Structure ◽  
Short Range ◽  
Direct Evidence ◽  
Nearest Neighbor ◽  
Compound System ◽  
Local Distribution ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

ABSTRACTLocal structure around the constituent atoms in the compound system Y1-xPrxBa2CU3O7-y has been investigated by means of x-ray absorption fine structure (XAFS) techniques. By comparing the local structure in the compound x=1 with its counterpart x=0, the XAFS results provide a direct evidence that Pr has replaced Y in the material. The nearest-neighbor structure in the CuO2 planes seems to remain intact as × varies from 0 to 1, indicating that substitution of Pr for Y does not disturb the local distribution of holes in the CuO2 planes. We suggest that local disorder and distortions in the second-neighbor bonding configuration could be responsible for suppression of superconductivity with increasing Pr content in the system.

Short-range atomic structure of 1 wt. % Ga δ-stabilized plutonium by x-ray-absorption fine-structure spectroscopy

1995 ◽  
Vol 51 (2) ◽  
pp. 751-755 ◽  
Author(s):  
L. E. Cox ◽  
R. Martinez ◽  
J. H. Nickel ◽  
S. D. Conradson ◽  
P. G. Allen
Keyword(s):  
Fine Structure ◽  
Atomic Structure ◽  
Short Range ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X-ray absorption fine structure study of short-range order of iron in Fe/Al multilayers

2000 ◽  
Vol 87 (10) ◽  
pp. 7218-7226 ◽  
Author(s):  
Dirk C. Meyer ◽  
Kurt Richter ◽  
Peter Paufler ◽  
Peter Gawlitza ◽  
Thomas Holz
Keyword(s):  
Fine Structure ◽  
Short Range ◽  
Short Range Order ◽  
Structure Study ◽  
Range Order ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Diffraction Anomalous Fine Structure: A New Technique for Probing Local Atomic Environment

1993 ◽  
Vol 307 ◽  
Author(s):  
Ingrid J. Pickering ◽  
Michael Sansone ◽  
James Marsch ◽  
Graham N. George
Keyword(s):  
Fine Structure ◽  
Absorption Edge ◽  
Short Range ◽  
Structural Information ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Absorbance Spectrum ◽  
X Ray ◽  
A New Technique ◽  
X Ray Absorption

ABSTRACTDiffraction anomalous fine structure (DAFS) is the fine structure in the intensity of an X-ray diffraction peak in the vicinity of an absorption edge. DAFS is measured by monitoring the intensity of a diffraction peak as a function of the incident X-ray energy as it is scanned through an absorption edge. It combines the short range structural sensitivity of X-ray absorption spectroscopy with the long range periodicity of X-ray diffraction, and can provide structural information which is not available from these techniques alone, or in combination. We present a methodology which allows extraction of a specific X-ray absorbance spectrum from the DAFS spectrum, and illustrate it for KMnO4. We also demonstrate the ability of DAFS to separate the contributions to the X-ray absorption spectrum of the tetrahedral and octahedral cobalt sites in the spinel Co3O4.

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