Valence-band density of states of near-noble-metal (Ni,Pd,Pt) monosilicides by using soft-x-ray-emission spectroscopy

1994 ◽  
Vol 50 (16) ◽  
pp. 11564-11569 ◽  
Author(s):  
S. Yamauchi ◽  
S. Kawamoto ◽  
M. Hirai ◽  
M. Kusaka ◽  
M. Iwami ◽  
...  
Keyword(s):  
Valence Band ◽  
Noble Metal ◽  
Density Of States ◽  
Emission Spectroscopy ◽  
X Ray

Valence Band Density of States of Palladium Silicides Studied by X-Ray Emission Spectroscopy (XES)

1993 ◽  
Vol 32 (Part 2, No. 4B) ◽  
pp. L597-L600 ◽  
Author(s):  
Satoshi Kawamoto ◽  
Masaaki Hirai ◽  
Masahiko Kusaka ◽  
Hatsuo Nakamura ◽  
Motohiro Iwami ◽  
...  
Keyword(s):  
Valence Band ◽  
Density Of States ◽  
Emission Spectroscopy ◽  
X Ray

Valence Band Density of States of the Manganese Silicides Studied by Soft X-Ray Emission Spectroscopy

1998 ◽  
Vol 67 (1) ◽  
pp. 230-233 ◽  
Author(s):  
Jinliang Wang ◽  
Masaaki Hirai ◽  
Masahiko Kusaka ◽  
Motohiro Iwami
Keyword(s):  
Valence Band ◽  
Density Of States ◽  
Emission Spectroscopy ◽  
X Ray

Valence Band Density of States of the Iron Silicides Studied by Soft X-Ray Emission Spectroscopy

1994 ◽  
Vol 63 (11) ◽  
pp. 4097-4101 ◽  
Author(s):  
Megumi Kasaya ◽  
Shoichi Yamauchi ◽  
Masaaki Hirai ◽  
Masahiko Kusaka ◽  
Motohiro Iwami ◽  
...  
Keyword(s):  
Valence Band ◽  
Density Of States ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Iron Silicides

Local partial densities of states in CuInS2 upper valence band determined by soft-x-ray emission spectroscopy: Evidence for In 5p contribution

2005 ◽  
Vol 98 (1) ◽  
pp. 013704 ◽  
Author(s):  
L. Zhang ◽  
I. Konovalov ◽  
D. Wett ◽  
D. Schulze ◽  
R. Szargan ◽  
...  
Keyword(s):  
Valence Band ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Densities Of States

Electronic density of states and the x-ray photoelectron spectra of the valence band of Cu-Pd alloys

1986 ◽  
Vol 33 (4) ◽  
pp. 2370-2379 ◽  
Author(s):  
H. Winter ◽  
P. J. Durham ◽  
W. M. Temmerman ◽  
G. M. Stocks
Keyword(s):  
Valence Band ◽  
Density Of States ◽  
Photoelectron Spectra ◽  
Electronic Density ◽  
X Ray ◽  
Electronic Density Of States

Soft X-Ray Emission Spectroscopy (SXES) Study of the Valence Band Electronic Structure of a Au-Si Alloy

1991 ◽  
Vol 30 (Part 1, No. 9A) ◽  
pp. 1928-1930 ◽  
Author(s):  
Hirokuni Watabe ◽  
Motohiro Iwami ◽  
Masaaki Hirai ◽  
Masahiko Kusaka ◽  
Hatsuo Nakamura
Keyword(s):  
Electronic Structure ◽  
Valence Band ◽  
Emission Spectroscopy ◽  
X Ray

Atomic Contribution to Valence Band Density of States in Gallium Oxide and Silicon Oxide Nano Layered Films

2010 ◽  
Vol 297-301 ◽  
pp. 849-852
Author(s):  
Toshio Takeuchi ◽  
Jiro Nishinaga ◽  
Atsushi Kawaharazuka ◽  
Yoshiji Horikoshi
Keyword(s):  
Valence Band ◽  
Density Of States ◽  
Photoelectron Spectroscopy ◽  
Gallium Oxide ◽  
Silicon Oxide ◽  
Rf Magnetron Sputtering ◽  
X Ray ◽  
Analytical Technique ◽  
Sapphire Substrates ◽  
Atomic Contribution

High resolution X-ray photoelectron spectroscopy (XPS) is used to investigate the spectra of nanolayered films. Amorphous gallium oxide (Ga2O3)-silicon dioxide (SiO2) nanolayered thin films are grown using ultrahigh vacuum radio frequency (rf) magnetron sputtering on sapphire substrates at room temperature. Films are layered with 15-angstrom Ga2O3 oxide and 75-angstrom SiO2 for a total of 10 layers. Referring to atomic core levels, atomic contribution to valence band density of states is experimentally nominated. This analytical technique has particular applicability to the evaluation of the density of states with atomic contributions.

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