Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers

G. Hollinger; R. Skheyta-Kabbani; M. Gendry

doi:10.1103/physrevb.49.11159

Oxides on GaAs and InAs surfaces: An x-ray-photoelectron-spectroscopy study of reference compounds and thin oxide layers

Physical Review B ◽

10.1103/physrevb.49.11159 ◽

1994 ◽

Vol 49 (16) ◽

pp. 11159-11167 ◽

Cited By ~ 225

Author(s):

G. Hollinger ◽

R. Skheyta-Kabbani ◽

M. Gendry

Keyword(s):

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Oxide Layers ◽

X Ray ◽

Thin Oxide

Download Full-text

X-ray photoelectron spectroscopy study of thin oxide layers formed on (001)-oriented β-NiAl single-crystal surfaces

Surface and Interface Analysis ◽

10.1002/sia.1351 ◽

2002 ◽

Vol 34 (1) ◽

pp. 519-523 ◽

Cited By ~ 20

Author(s):

Nicolas Frémy ◽

Vincent Maurice ◽

Philippe Marcus

Keyword(s):

Single Crystal ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Crystal Surfaces ◽

Oxide Layers ◽

Single Crystal Surfaces ◽

X Ray ◽

Thin Oxide

Download Full-text

X-ray photoelectron spectroscopy study of ultrathin oxide layers on Al and Si substrates

Thin Solid Films ◽

10.1016/0040-6090(93)90382-y ◽

1993 ◽

Vol 226 (2) ◽

pp. 219-223 ◽

Cited By ~ 7

Author(s):

T.J. Šarapatka

Keyword(s):

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

Oxide Layers ◽

X Ray ◽

Si Substrates ◽

Ultrathin Oxide

Download Full-text

Thickness determination of thin oxide layers on metal surfaces using X-ray photoelectron spectroscopy.

BUNSEKI KAGAKU ◽

10.2116/bunsekikagaku.40.11_691 ◽

1991 ◽

Vol 40 (11) ◽

pp. 691-696 ◽

Cited By ~ 1

Author(s):

Kazuaki OKUDA ◽

Akio ITOH

Keyword(s):

Photoelectron Spectroscopy ◽

Metal Surfaces ◽

Oxide Layers ◽

X Ray ◽

Thickness Determination ◽

Thin Oxide

Download Full-text

7425. X-ray photoelectron spectroscopy/Ar+ ion profile study of thin oxide layers on InP

Vacuum ◽

10.1016/0042-207x(91)91232-d ◽

1991 ◽

Vol 42 (8-9) ◽

pp. 597

Keyword(s):

Photoelectron Spectroscopy ◽

Oxide Layers ◽

X Ray ◽

Thin Oxide ◽

Profile Study

Download Full-text

X‐ray photoelectron spectroscopy/Ar+ ion profile study of thin oxide layers on InP

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576478 ◽

1990 ◽

Vol 8 (5) ◽

pp. 3669-3675 ◽

Cited By ~ 22

Author(s):

S. M. Thurgate ◽

N. E. Erickson

Keyword(s):

Photoelectron Spectroscopy ◽

Oxide Layers ◽

X Ray ◽

Thin Oxide ◽

Profile Study

Download Full-text

X-Ray Photoelectron Spectroscopy Depth Profiling of Electrochemically Prepared Thin Oxide Layers on Duplex Stainless Steel

Metallurgical and Materials Transactions B ◽

10.1007/s11663-011-9532-3 ◽

2011 ◽

Vol 42 (5) ◽

pp. 1044-1050 ◽

Cited By ~ 5

Author(s):

Črtomir Donik ◽

Aleksandra Kocijan ◽

Djordje Mandrino ◽

Monika Jenko

Keyword(s):

Stainless Steel ◽

Duplex Stainless Steel ◽

Photoelectron Spectroscopy ◽

Depth Profiling ◽

Oxide Layers ◽

X Ray ◽

Thin Oxide

Download Full-text

X-Ray Photoelectron Spectroscopy Study of Si-C Film Growth by Chemical Vapor Deposition of Ethylene on Si(100)

10.21236/ada197437 ◽

1988 ◽

Author(s):

P. A. Taylor ◽

M. Bozack ◽

W. J. Choyke ◽

J. T. Yates ◽

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Film Growth ◽

Chemical Vapor ◽

Spectroscopy Study ◽

X Ray

Download Full-text

Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

A high-resolution X-ray photoelectron spectroscopy study of trifluoroacetic anhydride labelling of hydroxyl groups: demonstration of the β shift due to OC(O)CF3

Polymer ◽

10.1016/0032-3861(93)90418-a ◽

1993 ◽

Vol 34 (9) ◽

pp. 1795-1799 ◽

Cited By ~ 35

Author(s):

A.P. Ameen ◽

R.J. Ward ◽

R.D. Short ◽

G. Beamson ◽

D. Briggs

Keyword(s):

High Resolution ◽

Photoelectron Spectroscopy ◽

Trifluoroacetic Anhydride ◽

Hydroxyl Groups ◽

Spectroscopy Study ◽

X Ray

Download Full-text

An X-ray photoelectron spectroscopy study of the surface layers between diamond crystallites and silicon substrate deposited by microwave-plasma-assisted chemical vapour deposition

Diamond and Related Materials ◽

10.1016/0925-9635(93)90120-q ◽

1993 ◽

Vol 2 (2-4) ◽

pp. 558-561 ◽

Cited By ~ 5

Author(s):

S. Haq ◽

C. Somerton ◽

D. Tunnicliffe ◽

J.A. Savage ◽

P. John ◽

...

Keyword(s):

Chemical Vapour Deposition ◽

Silicon Substrate ◽

Photoelectron Spectroscopy ◽

Vapour Deposition ◽

Microwave Plasma ◽

Chemical Vapour ◽

Spectroscopy Study ◽

Surface Layers ◽

X Ray

Download Full-text