Characterizing hot-carrier transport in silicon heterostructures with the use of ballistic-electron-emission microscopy

1993 ◽  
Vol 48 (8) ◽  
pp. 5712-5715 ◽  
Author(s):  
L. D. Bell ◽  
S. J. Manion ◽  
M. H. Hecht ◽  
W. J. Kaiser ◽  
R. W. Fathauer ◽  
...  
Keyword(s):  
Electron Emission ◽  
Carrier Transport ◽  
Ballistic Electron Emission Microscopy ◽  
Hot Carrier ◽  
Ballistic Electron ◽  
Emission Microscopy ◽  
Silicon Heterostructures

Probing hot-carrier transport and elastic scattering using ballistic-electron-emission microscopy

1992 ◽  
Vol 46 (19) ◽  
pp. 12826-12829 ◽  
Author(s):  
A. M. Milliken ◽  
S. J. Manion ◽  
W. J. Kaiser ◽  
L. D. Bell ◽  
M. H. Hecht
Keyword(s):  
Elastic Scattering ◽  
Electron Emission ◽  
Carrier Transport ◽  
Ballistic Electron Emission Microscopy ◽  
Hot Carrier ◽  
Ballistic Electron ◽  
Emission Microscopy

scholarly journals Hot-carrier scattering in a metal: A ballistic-electron-emission microscopy investigation on PtSi

1993 ◽  
Vol 48 (12) ◽  
pp. 8833-8839 ◽  
Author(s):  
Philipp Niedermann ◽  
Lidia Quattropani ◽  
Katalin Solt ◽  
Ivan Maggio-Aprile ◽  
O/ystein Fischer
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Hot Carrier ◽  
Ballistic Electron ◽  
Carrier Scattering ◽  
Microscopy Investigation ◽  
Emission Microscopy

THE ROLE OF BALLISTIC ELECTRON EMISSION MICROSCOPY FOR CHARACTERIZATION OF PHYSICAL PHENOMENA IN SEMICONDUCTOR ALLOYS AND QUANTUM STRUCTURES

2000 ◽  
Vol 10 (01) ◽  
pp. 55-74
Author(s):  
VENKATESH NARAYANAMURTI ◽  
MICHAEL KOZHEVNIKOV
Keyword(s):  
Electron Emission ◽  
Carrier Transport ◽  
Optical Emission ◽  
Spectroscopic Properties ◽  
Ballistic Electron Emission Microscopy ◽  
Semiconductor Alloys ◽  
Ballistic Electron ◽  
Quantum Objects ◽  
Emission Microscopy ◽  
General Aspects

The measurement of the physical properties of individual semiconductor quantum objects at a length scale corresponding to the de Broglie wavelength of electrons in most semiconductors (a few mm) is a difficult challenge. Determination of spectroscopic properties of individual quantum objects buried below the surface is particularly daunting. In this paper we will review briefly recent progress in the use of BEEM (ballistic electron emission microscopy) for the study of semiconductor alloys and novel quantum objects. We will also discuss general aspects of BEEM experiment and theory in true ballistic and quasi-ballistic hot carrier transport. Examples of the use of this technique for studying buried heterojunctions will be presented. Potential modifications of the technique for imaging the optical emission under conditions of ballistic electron injection will also be discussed.

scholarly journals Theory of ballistic electron emission microscopy

2001 ◽  
Vol 66 (1-2) ◽  
pp. 3-51 ◽  
Author(s):  
P.L. de Andres ◽  
F.J. Garcia-Vidal ◽  
K. Reuter ◽  
F. Flores
Keyword(s):  
Electron Emission ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy

Observation of misfit dislocations at the InxGa1−xAs/GaAs interface by ballistic‐electron‐emission microscopy

1996 ◽  
Vol 69 (7) ◽  
pp. 940-942 ◽  
Author(s):  
E. Y. Lee ◽  
S. Bhargava ◽  
M. A. Chin ◽  
V. Narayanamurti ◽  
K. J. Pond ◽  
...  
Keyword(s):  
Electron Emission ◽  
Misfit Dislocations ◽  
Ballistic Electron Emission Microscopy ◽  
Ballistic Electron ◽  
Emission Microscopy
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