Infrared absorption by interstitial oxygen in germanium-doped silicon crystals

1993 ◽  
Vol 47 (15) ◽  
pp. 9338-9345 ◽  
Author(s):  
Hiroshi Yamada-Kaneta ◽  
Chioko Kaneta ◽  
Tsutomu Ogawa
Keyword(s):  
Infrared Absorption ◽  
Interstitial Oxygen ◽  
Silicon Crystals ◽  
Doped Silicon

Infrared Absorption by Interstitial Oxygen in Germanium-Doped Silicon Crystal

1992 ◽  
Vol 83-87 ◽  
pp. 419-424 ◽  
Author(s):  
Hiroshi Yamada-Kaneta ◽  
Chioko Kaneta ◽  
Tsutomu Ogawa
Keyword(s):  
Infrared Absorption ◽  
Silicon Crystal ◽  
Interstitial Oxygen ◽  
Doped Silicon

Oxygen precipitation behavior in heavily arsenic doped silicon crystals

2017 ◽  
Vol 457 ◽  
pp. 325-330 ◽  
Author(s):  
Stephan Haringer ◽  
Daniela Gambaro ◽  
Maria Porrini
Keyword(s):  
Precipitation Behavior ◽  
Silicon Crystals ◽  
Oxygen Precipitation ◽  
Doped Silicon

Effect of high hydrostatic pressure on the electrophysical properties of doped silicon crystals and devices based on them

1995 ◽  
Vol 38 (3) ◽  
pp. 693-695
Author(s):  
S.Z. Zainabidinov ◽  
P.I. Baranskiy ◽  
I.N. Karimov ◽  
A.R. Turaev ◽  
Kh.Kh. Karimberdiev
Keyword(s):  
Hydrostatic Pressure ◽  
High Hydrostatic Pressure ◽  
Electrophysical Properties ◽  
Silicon Crystals ◽  
Doped Silicon

Research of mechanical stresses in irradiated tin-doped silicon crystals

2017 ◽  
Vol 71 ◽  
pp. 263-267
Author(s):  
Igor Matyash ◽  
Irina Minailova ◽  
Boris Serdega
Keyword(s):  
Mechanical Stresses ◽  
Silicon Crystals ◽  
Doped Silicon

scholarly journals INFRARED ABSORPTION OF DOPED SILICON PASSIVATED BY ATOMIC HYDROGEN, DEUTERIUM AND IMPLANTED BY PROTON

1987 ◽  
Vol 36 (11) ◽  
pp. 1427
Author(s):  
DU YONG-CHANG ◽  
YAN MAO-XUN ◽  
ZHANG YU-FENG ◽  
GUO HAI ◽  
HU KE-LIANG
Keyword(s):  
Infrared Absorption ◽  
Atomic Hydrogen ◽  
Doped Silicon ◽  
Hydrogen Deuterium

scholarly journals Thermal wave microscopy of doped silicon crystals

1981 ◽  
Vol 70 (S1) ◽  
pp. S57-S57
Author(s):  
R. C. Farrow ◽  
M. K. Thomas ◽  
D. C. Joy
Keyword(s):  
Thermal Wave ◽  
Silicon Crystals ◽  
Doped Silicon

Interlaboratory Determination of the Calibration Factor for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption

2019 ◽  
Vol 136 (7) ◽  
pp. 2015-2024 ◽  
Author(s):  
A. Baghdadi ◽  
W. M. Bullis ◽  
M. C. Croarkin ◽  
Yue‐zhen Li ◽  
R. I. Scace ◽  
...  
Keyword(s):  
Oxygen Content ◽  
Infrared Absorption ◽  
Calibration Factor ◽  
Interstitial Oxygen
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