Full-hemispherical photoelectron-diffraction data from Cu(001): Energy dependence and comparison with single-scattering-cluster simulations

1993 ◽  
Vol 47 (12) ◽  
pp. 7462-7479 ◽  
Author(s):  
D. Naumović ◽  
A. Stuck ◽  
T. Greber ◽  
J. Osterwalder ◽  
L. Schlapbach
1997 ◽  
Vol 04 (06) ◽  
pp. 1331-1335 ◽  
Author(s):  
C. ROJAS ◽  
J. A. MARTÍn-GAGO ◽  
E. ROMÁN ◽  
G. PAOLUCCI ◽  
B. BRENA ◽  
...  

Deposition of 0.5 Si monolayer (ML) on a Cu (110) surface at room temperature (RT) leads to the formation of a c(2×2) LEED pattern. In order to find out the surface atomic structure of this ordered phase, X-ray photoelectron diffraction (XPD) azimuthal scans at different photon energies and full hemispherical XPD patterns of the Si 2 p core level have been measured using both synchrotron radiation and a laboratory source. We present an atomic model for the surface structure based on the examination of forward scattering and first order interference XPD features. Refinement of the structural parameters was achieved by performing single scattering cluster (SSC) calculations. In the proposed model Si atoms replace Cu atoms at the surface along the [Formula: see text] atomic rows.


1987 ◽  
Vol 185 (3) ◽  
pp. L527-L533 ◽  
Author(s):  
D. Sebilleau ◽  
M.C. Desjonqueres ◽  
D. Chauveau ◽  
C. Guillot ◽  
J. Lecante ◽  
...  

1994 ◽  
Vol 01 (04) ◽  
pp. 569-571 ◽  
Author(s):  
M. BOWKER ◽  
M. NEWTON ◽  
S.M. FRANCIS ◽  
M. GLEESON ◽  
C. BARNES

X-ray photoelectron diffraction studies of this alloy surface have been carried out and indicate that there is a significant expansion of the lattice in the near-surface region due to the high concentration of Pd in layer 2. Preliminary single scattering calculations lend support to this proposal for the surface structure, and place this expansion in the subsurface mainly between layers 2 and 3.


1999 ◽  
Vol 59 (8) ◽  
pp. 5857-5870 ◽  
Author(s):  
P. M. Len ◽  
J. D. Denlinger ◽  
E. Rotenberg ◽  
S. D. Kevan ◽  
B. P. Tonner ◽  
...  

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