Potassium-induced charge redistribution on Si(111) surfaces studied by core-level photoemission spectroscopy

1992 ◽  
Vol 45 (11) ◽  
pp. 5961-5964 ◽  
Author(s):  
Y. Ma ◽  
C. T. Chen ◽  
G. Meigs ◽  
F. Sette ◽  
G. Illing ◽  
...  
2012 ◽  
Vol 97 (1) ◽  
pp. 17010 ◽  
Author(s):  
L. Fernandes dos Santos ◽  
Yu. A. Pusep ◽  
G. M. Gusev ◽  
A. K. Bakarov ◽  
A. I. Toropov

Author(s):  
F. U. Hillebrecht ◽  
Ch. Roth ◽  
H. B. Rose ◽  
E. Kisker

2007 ◽  
Vol 310 (2) ◽  
pp. e252-e254 ◽  
Author(s):  
T. Miyamachi ◽  
A. Sekiyama ◽  
S. Imada ◽  
H. Fujiwara ◽  
T. Saita ◽  
...  

2020 ◽  
Vol 238 ◽  
pp. 146889
Author(s):  
Kentaro Kuga ◽  
Yuina Kanai ◽  
Hidenori Fujiwara ◽  
Kohei Yamagami ◽  
Satoru Hamamoto ◽  
...  

1998 ◽  
Vol 88-91 ◽  
pp. 369-375 ◽  
Author(s):  
K.G. Nath ◽  
Y. Ufuktepe ◽  
S. Kimura ◽  
T. Kinoshita ◽  
H. Kumigashira ◽  
...  

Nanoscale ◽  
2019 ◽  
Vol 11 (33) ◽  
pp. 15472-15478 ◽  
Author(s):  
Donghai Wu ◽  
Baocheng Yang ◽  
Houyang Chen ◽  
Eli Ruckenstein

Tensile and compressive strains are effective ways for charge redistribution to reactivate adsorption sites on electrode materials.


2011 ◽  
Vol 675-677 ◽  
pp. 15-19 ◽  
Author(s):  
T. Shirasawa ◽  
S. Tanaka ◽  
T. Muro ◽  
Y. Tamenori ◽  
Y. Harada ◽  
...  

The epitaxial silicon oxynitride (SiON) layer grown on a 6H-SiC(0001) surface is studied with core level photoemission spectroscopy. Si 2p spectra show three spectral components other than the bulk one. Chemical shifts and emission angle dependence of these components are well explained within a framework of a determined structure model of the SiON layer.


2002 ◽  
Vol 734 ◽  
Author(s):  
X. D. Feng ◽  
D. Grozea ◽  
Z. H. Lu

ABSTRACTWe studied the poly [2-methoxy-5-(2'-ethylhexyloxy)-1,4-phenylenevinylene] (MEH-PPV)/LiF/Al interface by angle-dependent X-ray photoemission spectroscopy (XPS). The changes in the C1s, O 1s, Al 2p core level spectra, and the evolution of O to C and Li to F atomic ratios at different photoelectron take-off angles were carefully analyzed. A reduced oxygen concentration with a LiF layer at the interface suggests that LiF can help reduce the oxidation of Al. The interface was found rich in Li+ ions, some of which might be attached to MEH-PPV to form “N type” doping. The electron injection layer consists of Li+doped MEH-PPV, LiF, Al oxides, and metallic Al.


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