Noise, intermittency, and mode locking in sliding-charge-density-wave conductors

1988 ◽  
Vol 38 (14) ◽  
pp. 10093-10096 ◽  
Author(s):  
S. Bhattacharya ◽  
M. J. Higgins ◽  
J. P. Stokes ◽  
R. A. Klemm
2002 ◽  
Vol 12 (9) ◽  
pp. 103-108
Author(s):  
E. Slot ◽  
H. S.J. van der Zant

We have fabricated a variety of Charge-Density-Wave (CDW) devices using a focused-ion-beam (FIB) process. The FIB is used to etch any desired geometry in crystals, like constrictions, tears, trenches, zigzag patterns etcetera. We have studied the electrical transport of these devices. This study includes: finite size effects (e.g. dependence of the threshold for CDW sliding on the width while maintaining the same thickness of samples), conduction perpendicular to the chains, geometrical effects and CDW junctions. We have found complete mode-locking on CDW constrictions, indicating that the high-quality crystal properties are preserved after FIB processing. This makes the process a useful technique to study submicron CDW dynamics.


1994 ◽  
Vol 49 (15) ◽  
pp. 10113-10119 ◽  
Author(s):  
J. McCarten ◽  
D. A. DiCarlo ◽  
R. E. Thorne

1988 ◽  
Vol 38 (10) ◽  
pp. 7177-7180 ◽  
Author(s):  
S. Bhattacharya ◽  
M. J. Higgins ◽  
J. P. Stokes

1993 ◽  
Vol 70 (24) ◽  
pp. 3784-3787 ◽  
Author(s):  
Mark J. Higgins ◽  
A. Alan Middleton ◽  
S. Bhattacharya

1988 ◽  
Vol 37 (17) ◽  
pp. 10055-10067 ◽  
Author(s):  
R. E. Thorne ◽  
J. S. Hubacek ◽  
W. G. Lyons ◽  
J. W. Lyding ◽  
J. R. Tucker

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