Dimensionality dependence of mode-locking dynamics in charge-density-wave transport

1994 ◽  
Vol 49 (15) ◽  
pp. 10113-10119 ◽  
Author(s):  
J. McCarten ◽  
D. A. DiCarlo ◽  
R. E. Thorne
2021 ◽  
Vol 118 (22) ◽  
pp. 223105
Author(s):  
M. V. Nikitin ◽  
S. G. Zybtsev ◽  
V. Ya. Pokrovskii ◽  
B. A. Loginov

2002 ◽  
Vol 12 (9) ◽  
pp. 103-108
Author(s):  
E. Slot ◽  
H. S.J. van der Zant

We have fabricated a variety of Charge-Density-Wave (CDW) devices using a focused-ion-beam (FIB) process. The FIB is used to etch any desired geometry in crystals, like constrictions, tears, trenches, zigzag patterns etcetera. We have studied the electrical transport of these devices. This study includes: finite size effects (e.g. dependence of the threshold for CDW sliding on the width while maintaining the same thickness of samples), conduction perpendicular to the chains, geometrical effects and CDW junctions. We have found complete mode-locking on CDW constrictions, indicating that the high-quality crystal properties are preserved after FIB processing. This makes the process a useful technique to study submicron CDW dynamics.


1984 ◽  
Vol 45 (3) ◽  
pp. 113-119 ◽  
Author(s):  
H. Mutka ◽  
S. Bouffard ◽  
G. Mihály ◽  
L. Mihály

2018 ◽  
Vol 98 (3) ◽  
Author(s):  
Yafang Yang ◽  
Shiang Fang ◽  
Valla Fatemi ◽  
Jonathan Ruhman ◽  
Efrén Navarro-Moratalla ◽  
...  

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