Schottky-barrier heights of transition-metal-silicide–silicon contacts studied by x-ray photoelectron spectroscopy measurements
Keyword(s):
X Ray
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2018 ◽
Vol 10
(4)
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pp. 4333-4340
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1985 ◽
Vol 18
(4)
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pp. 947-959
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Keyword(s):
2007 ◽
Vol 46
(No. 2)
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pp. L28-L30
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1989 ◽
pp. 259-268
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Keyword(s):