Determination of bond strengths of arsenic and arsenic chalcogen compounds using the temperature dependence of extended x-ray-absorption fine structure

1987 ◽  
Vol 36 (2) ◽  
pp. 980-988 ◽  
Author(s):  
C. Y. Yang ◽  
M. A. Paesler ◽  
D. E. Sayers
Keyword(s):  
Fine Structure ◽  
Temperature Dependence ◽  
X Ray ◽  
Absorption Fine ◽  
Bond Strengths ◽  
X Ray Absorption

scholarly journals Determination of Chemical Form of Antimony in Contaminated Soil around a Smelter Using X-ray Absorption Fine Structure

2005 ◽  
Vol 21 (7) ◽  
pp. 769-773 ◽  
Author(s):  
Masaki TAKAOKA ◽  
Satoshi FUKUTANI ◽  
Takashi YAMAMOTO ◽  
Masato HORIUCHI ◽  
Naoya SATTA ◽  
...  
Keyword(s):  
Fine Structure ◽  
Contaminated Soil ◽  
Chemical Form ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Extended x-ray-absorption fine-structure technique. III. Determination of physical parameters

1975 ◽  
Vol 11 (12) ◽  
pp. 4836-4846 ◽  
Author(s):  
E. A. Stern ◽  
D. E. Sayers ◽  
F. W. Lytle
Keyword(s):  
Fine Structure ◽  
Physical Parameters ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

scholarly journals Exafs Studies of Multilayer Interfaces

1988 ◽  
Vol 143 ◽  
Author(s):  
S. M. Heald ◽  
G. M. Lamble
Keyword(s):  
Fine Structure ◽  
Standing Wave ◽  
Structural Disorder ◽  
Interface Structure ◽  
X Ray ◽  
Absorption Fine ◽  
High Degree ◽  
X Ray Absorption ◽  
Multilayer Materials

AbstractImportant for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.

Determination of the Structures of Antiinflammatory Copper(II) Dimers of Indomethacin by Multiple-Scattering Analyses of X-ray Absorption Fine Structure Data

2001 ◽  
Vol 40 (6) ◽  
pp. 1295-1302 ◽  
Author(s):  
Jane E. Weder ◽  
Trevor W. Hambley ◽  
Brendan J. Kennedy ◽  
Peter A. Lay ◽  
Garry J. Foran ◽  
...  
Keyword(s):  
Fine Structure ◽  
Multiple Scattering ◽  
Structure Data ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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