Characterization of tellurium impurities in crystalline ZnSiP2using polarized Raman scattering
2011 ◽
Vol 21
(3)
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pp. 3352-3355
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Keyword(s):
Keyword(s):
2019 ◽
Vol 235
◽
pp. 121726
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1998 ◽
Vol 189-190
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pp. 435-438
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Keyword(s):
2008 ◽
Vol 873
(1-3)
◽
pp. 149-159
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