Characterization of tellurium impurities in crystalline ZnSiP2using polarized Raman scattering

1984 ◽  
Vol 30 (12) ◽  
pp. 7097-7104 ◽  
Author(s):  
S. A. Lopez-Rivera ◽  
H. Galindo ◽  
B. Fontal ◽  
M. Briceño
Nanoscale ◽  
2016 ◽  
Vol 8 (14) ◽  
pp. 7672-7682 ◽  
Author(s):  
R. Srikantharajah ◽  
K. Gerstner ◽  
S. Romeis ◽  
W. Peukert

1998 ◽  
Vol 189-190 ◽  
pp. 435-438 ◽  
Author(s):  
Hiroshi Harima ◽  
Toshiaki Inoue ◽  
Shin-ichi Nakashima ◽  
Hajime Okumura ◽  
Yuuki Ishida ◽  
...  

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