Structural characterization of an ethylene-tetrafluoroethylene alternating copolymer by polarized Raman scattering

1983 ◽  
Vol 16 (3) ◽  
pp. 446-452 ◽  
Author(s):  
Karen Zabel ◽  
N. E. Schlotter ◽  
John F. Rabolt
Keyword(s):  
Raman Scattering ◽  
Structural Characterization ◽  
Alternating Copolymer ◽  
Polarized Raman ◽  
Ethylene Tetrafluoroethylene

Characterization of tellurium impurities in crystalline ZnSiP2using polarized Raman scattering

1984 ◽  
Vol 30 (12) ◽  
pp. 7097-7104 ◽  
Author(s):  
S. A. Lopez-Rivera ◽  
H. Galindo ◽  
B. Fontal ◽  
M. Briceño
Keyword(s):  
Raman Scattering ◽  
Polarized Raman

scholarly journals Multimodal Structural Characterization of Ge–S–I Glasses by Combination of DFT Calculation and IR and Polarized Raman Spectroscopy

2019 ◽  
Vol 123 (6) ◽  
pp. 3758-3769
Author(s):  
Matthieu Chazot ◽  
Raphaël Mereau ◽  
Mohammed El Amraoui ◽  
Frédéric Adamietz ◽  
Younès Messaddeq ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Structural Characterization ◽  
Dft Calculation ◽  
Polarized Raman Spectroscopy ◽  
Polarized Raman

Structural characterization of DC magnetron-sputtered TiO2 thin films using XRD and Raman scattering studies

2003 ◽  
Vol 6 (5-6) ◽  
pp. 547-550 ◽  
Author(s):  
B. Karunagaran ◽  
R.T. Rajendra Kumar ◽  
V. Senthil Kumar ◽  
D. Mangalaraj ◽  
Sa.K. Narayandass ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
Structural Characterization ◽  
Tio2 Thin Films

scholarly journals Polarized Raman scattering and SEM combined full characterization of self-assembled nematic thin films

Nanoscale ◽  
2016 ◽  
Vol 8 (14) ◽  
pp. 7672-7682 ◽  
Author(s):  
R. Srikantharajah ◽  
K. Gerstner ◽  
S. Romeis ◽  
W. Peukert
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
Full Characterization ◽  
Self Assembled ◽  
Polarized Raman

Structural characterization of heterocyclic polymer networks by low-frequency Raman scattering

1994 ◽  
Vol 25 (2) ◽  
pp. 139-143 ◽  
Author(s):  
V. N. Novikov ◽  
A. P. Shebanin ◽  
V. P. Azarenkov ◽  
A. V. Baibak ◽  
Yu. V. Kramarenko ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Structural Characterization ◽  
Polymer Networks ◽  
Low Frequency ◽  
Heterocyclic Polymer

Structural characterization of wavelength-dependent Raman scattering and laser-induced crystallization of silicon thin films

2013 ◽  
Vol 542 ◽  
pp. 388-392 ◽  
Author(s):  
Young-Joo Lee ◽  
Jung-Dae Kwon ◽  
Dong-Ho Kim ◽  
Kee-Seok Nam ◽  
Yongsoo Jeong ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
Structural Characterization ◽  
Silicon Thin Films ◽  
Induced Crystallization
Sign in / Sign up

Export Citation Format

Share Document