Reply to "Electronic structure of oxygen in gallium phosphide"

1983 ◽  
Vol 28 (10) ◽  
pp. 6107-6109 ◽  
Author(s):  
T. N. Morgan
1998 ◽  
Vol 297 (1-2) ◽  
pp. 133-140 ◽  
Author(s):  
Travis R. Taylor ◽  
Knut R. Asmis ◽  
Cangshan Xu ◽  
Daniel M. Neumark

2019 ◽  
Vol 6 (5) ◽  
Author(s):  
Matthias May ◽  
Helena Stange ◽  
Jonas Weinrich ◽  
Thomas Hannappel ◽  
Oliver Supplie

The initial interaction of water with semiconductors determines the electronic structure of the solid–liquid interface. The exact nature of this interaction is, however, often unknown. Here, we study gallium phosphide-based surfaces exposed to H_22O by means of in situ reflection anisotropy spectroscopy. We show that the introduction of typical imperfections in the form of surface steps or trace contaminants not only changes the dynamics of the interaction, but also its qualitative nature. This emphasises the challenges for the comparability of experiments with (idealised) electronic structure models for electrochemistry.


2017 ◽  
Vol 381 (35) ◽  
pp. 2986-2992 ◽  
Author(s):  
Xuefeng Lu ◽  
Xu Gao ◽  
Cuixia Li ◽  
Junqiang Ren ◽  
Xin Guo ◽  
...  

2020 ◽  
pp. 77-82
Author(s):  
Alaa A. Al-Jobory ◽  
Wael, I. Ahmed ◽  
Ibrahim J. A.

In this work, the effects of x-value on electrical and optical properties was studied for the two dimensional (2D)GaAs1-xPxstructure by applying the density functional theory.We found that the gallium arsenide(GaAs) and gallium phosphide(GaP) monolayers are bound to each other, while the charge transfer between these two materialsleads to tuning the band gap value between 1.5 eV for GaAs to 2.24 eV for GaP. The density of state, band structure, and optical properties are investigated in this paper.


1983 ◽  
Vol 28 (10) ◽  
pp. 6104-6106 ◽  
Author(s):  
M. Jaros ◽  
P. J. Dean

2012 ◽  
Vol 02 (04) ◽  
pp. 267-274
Author(s):  
Mudar A. Abdulsattar ◽  
Mohammed T. Hussein ◽  
Raied K. Jamal ◽  
Thekra Kasim

Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.


Author(s):  
J. Fink

Conducting polymers comprises a new class of materials achieving electrical conductivities which rival those of the best metals. The parent compounds (conjugated polymers) are quasi-one-dimensional semiconductors. These polymers can be doped by electron acceptors or electron donors. The prototype of these materials is polyacetylene (PA). There are various other conjugated polymers such as polyparaphenylene, polyphenylenevinylene, polypoyrrole or polythiophene. The doped systems, i.e. the conducting polymers, have intersting potential technological applications such as replacement of conventional metals in electronic shielding and antistatic equipment, rechargable batteries, and flexible light emitting diodes.Although these systems have been investigated almost 20 years, the electronic structure of the doped metallic systems is not clear and even the reason for the gap in undoped semiconducting systems is under discussion.


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