High-resolution photothermal ionization spectroscopy of lithium-related shallow donors in germanium

1983 ◽  
Vol 27 (10) ◽  
pp. 6564-6567 ◽  
Author(s):  
L. S. Darken
Keyword(s):  
High Resolution ◽  
Shallow Donors ◽  
Photothermal Ionization ◽  
Photothermal Ionization Spectroscopy

High-Resolution Spectroscopy of Point Defects in Silicon

1989 ◽  
Vol 163 ◽  
Author(s):  
H.G. Grimmeiss ◽  
M. Kleverman ◽  
J. Olajos
Keyword(s):  
High Resolution ◽  
Transition Metals ◽  
Electronic Properties ◽  
Point Defects ◽  
High Resolution Spectroscopy ◽  
Paper Briefly ◽  
Excitation Spectra ◽  
Photothermal Ionization ◽  
Recent Developments ◽  
Photothermal Ionization Spectroscopy

AbstractThe paper briefly outlines recent developments in high resolution spectroscopy of point defects in silicon. One of the methods, namely photothermal ionization spectroscopy (PTIS) is discussed in detail. Impurities induced by selenium and several transition metals are used as examples m order to illustrate the powerful scope of both transmission and PTIS measurements. These measurements are capable of providing unique information on the electronic properties of point defects, even when the defects exhibit complex excitation spectra.

Contactless Photothermal Ionization Spectroscopy of Shallow Defects in Semiconductors

1993 ◽  
Vol 143-147 ◽  
pp. 1365-1370 ◽  
Author(s):  
Boris A. Andreev ◽  
V.B. Ikonnikov ◽  
E.B. Koslov ◽  
T.M. Lifshits ◽  
V.B. Shmagin
Keyword(s):  
Photothermal Ionization ◽  
Photothermal Ionization Spectroscopy ◽  
Defects In Semiconductors

Shallow Nitrogen Donor States in 4H-SiC Investigated by Photothermal Ionization Spectroscopy

2000 ◽  
Vol 338-342 ◽  
pp. 611-614 ◽  
Author(s):  
C.Q. Chen ◽  
Jan Zeman ◽  
F. Engelbrecht ◽  
Christian Peppermüller ◽  
Reinhard Helbig ◽  
...  
Keyword(s):  
Nitrogen Donor ◽  
Photothermal Ionization ◽  
Photothermal Ionization Spectroscopy ◽  
Donor States

Far‐infrared photothermal ionization spectroscopy of semiconductors in the presence of intrinsic light

1983 ◽  
Vol 54 (6) ◽  
pp. 3464-3474 ◽  
Author(s):  
M. J. H. van de Steeg ◽  
H. W. H. M. Jongbloets ◽  
J. W. Gerritsen ◽  
P. Wyder
Keyword(s):  
Far Infrared ◽  
Photothermal Ionization ◽  
Photothermal Ionization Spectroscopy

Application of photothermal ionization spectroscopy to the study of epitaxially grown germanium on silicon

1992 ◽  
Vol 72 (8) ◽  
pp. 3550-3553 ◽  
Author(s):  
H. Navarro ◽  
T. Timusk ◽  
W. R. Datars ◽  
D. C. Houghton
Keyword(s):  
Photothermal Ionization ◽  
Photothermal Ionization Spectroscopy
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