Frequency dependence of the Drude relaxation time in metal films: Further evidence for a two-carrier model

1975 ◽  
Vol 12 (12) ◽  
pp. 6002-6005 ◽  
Author(s):  
S. R. Nagel ◽  
S. E. Schnatterly
Keyword(s):  
Relaxation Time ◽  
Frequency Dependence ◽  
Metal Films ◽  
Carrier Model

Frequency dependence of the Drude relaxation time in metal films

1974 ◽  
Vol 9 (4) ◽  
pp. 1299-1303 ◽  
Author(s):  
S. R. Nagel ◽  
S. E. Schnatterly
Keyword(s):  
Relaxation Time ◽  
Frequency Dependence ◽  
Metal Films

scholarly journals A New Analytical Expression for the T.C.R. of Thin Monocrystalline Metal Films

1979 ◽  
Vol 5 (4) ◽  
pp. 209-213 ◽  
Author(s):  
C. R. Tellier
Keyword(s):  
Electrical Conductivity ◽  
Relaxation Time ◽  
Reflection Coefficient ◽  
Grain Boundary ◽  
Metal Film ◽  
Approximate Equation ◽  
Metal Films ◽  
Exact Equation ◽  
Temperature Coefficient Of Resistivity ◽  
Comparison Of The Results

The analysis of electrical conductivity of continuous thin monocrystalline metal film has been treated by assuming that the scattering from other sources than grain-boundaries can be described by an effective relaxation time. This relaxation time method is applied to the temperature coefficient of resistivity and leads to an analytical approximate equation in terms of the grain-boundary reflection coefficientrand the reduced thicknessk.Comparison of the results with those deduced from the exact equation (derived from the Mayadas and Shatzkes theory) shows that they deviate by less than 5% in largek–,p–, andr– ranges.

Frequency dependence of the optical relaxation time in metals

1982 ◽  
Vol 25 (2) ◽  
pp. 923-930 ◽  
Author(s):  
Jeffrey B. Smith ◽  
H. Ehrenreich
Keyword(s):  
Relaxation Time ◽  
Frequency Dependence

Contribution to the Dielectric Behavior of Relaxers from the Surface of Nano-Order Cluster in the Materials

1997 ◽  
Vol 492 ◽  
Author(s):  
Z. -Y. Cheng ◽  
Aqiang Guo ◽  
R. S. Katiyar
Keyword(s):  
Dielectric Constant ◽  
Relaxation Time ◽  
Frequency Dependence ◽  
Relaxor Ferroelectrics ◽  
Dielectric Behavior ◽  
Experimental Results ◽  
Time Analysis ◽  
Resonance Process

ABSTRACTBased on the analysis of the dielectric behavior of relaxor ferroelectrics, it is assumed that the material has two polarization processes. Thus, a formula, which can fit the experimental results very well, is proposed to describe the temperature and frequency dependence of the dielectric constant. The fitted results show that there is a resonance process in the material and the peak of the dielectric constant is determined with both the relaxation and resonance processes. The relaxation time analysis shows that the peak of the dielectric constant indeed consists of two parts.

scholarly journals On the Frequency Response of Nanostructured Thermoacoustic Loudspeakers

Nanomaterials ◽  
2018 ◽  
Vol 8 (10) ◽  
pp. 833 ◽  
Author(s):  
Paolo Torraca ◽  
Marco Bobinger ◽  
Maurizio Servadio ◽  
Paolo Pavan ◽  
Markus Becherer ◽  
...  
Keyword(s):  
Frequency Response ◽  
Frequency Dependence ◽  
Thermal Effects ◽  
Silver Nanowires ◽  
Metal Films ◽  
Acoustic Model ◽  
Acoustic Frequency ◽  
Frequency Responses ◽  
Acoustic Responses ◽  
Further Development

In this work, we investigate the thermal and acoustic frequency responses of nanostructured thermoacoustic loudspeakers. An opposite frequency dependence of thermal and acoustic responses was found independently of the device substrate (Kapton and glass) and the nanometric active film (silver nanowires and nm-thick metal films). The experimental results are interpreted with the support of a comprehensive electro-thermo-acoustic model, allowing for the separation of the purely thermal effects from the proper thermoacoustic (TA) transduction. The thermal interactions causing the reported opposite trends are understood, providing useful insights for the further development of the TA loudspeaker technology.

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