Collapse of vibrational structure in spectra of resonant x-ray Raman scattering

1997 ◽  
Vol 56 (1) ◽  
pp. 256-264 ◽  
Author(s):  
Faris Gel’mukhanov ◽  
Timofei Privalov ◽  
Hans Ågren
Keyword(s):  
Raman Scattering ◽  
Vibrational Structure ◽  
X Ray

scholarly journals Exploring the fundamental effects of deposition time on the microstructure of graphene nanoflakes by Raman scattering and X-ray diffraction

CrystEngComm ◽  
2011 ◽  
Vol 13 (1) ◽  
pp. 312-318 ◽  
Author(s):  
Navneet Soin ◽  
Susanta Sinha Roy ◽  
Christopher O'Kane ◽  
James A. D. McLaughlin ◽  
Teck H. Lim ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Deposition Time ◽  
X Ray Diffraction ◽  
X Ray ◽  
Graphene Nanoflakes

Magnetic resonance effect in x-ray resonant Raman scattering

1997 ◽  
Vol 56 (22) ◽  
pp. R14267-R14270 ◽  
Author(s):  
T. Iwazumi ◽  
K. Kobayashi ◽  
S. Kishimoto ◽  
T. Nakamura ◽  
S. Nanao ◽  
...  
Keyword(s):  
Magnetic Resonance ◽  
Raman Scattering ◽  
Resonance Effect ◽  
X Ray ◽  
Resonant Raman ◽  
Resonant Raman Scattering

Stimulated Raman scattering in helium with soft-x-ray laser radiation

1996 ◽  
Vol 54 (6) ◽  
pp. 5374-5377 ◽  
Author(s):  
E. E. Fill ◽  
S. J. van Enk ◽  
Jian Zhang ◽  
P. Lambropoulos
Keyword(s):  
Laser Radiation ◽  
Raman Scattering ◽  
Stimulated Raman Scattering ◽  
X Ray ◽  
Stimulated Raman

scholarly journals Evidence of a symmetric disordered ice above ~62 GPa from Raman scattering and X-ray diffraction investigations

1996 ◽  
Vol 52 (a1) ◽  
pp. C535-C535
Author(s):  
E. Wolanin ◽  
Ph. Pruzan ◽  
M. Gauthier ◽  
J. C. Chervin ◽  
B. Canny ◽  
...  
Keyword(s):  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray

X-Ray and Raman Studies of Interlayer Mixing in SimGem Superlattices

1991 ◽  
Vol 220 ◽  
Author(s):  
R. C. Bowman ◽  
P. M. Adams ◽  
S. J. Chang ◽  
V. Arbet-Engels ◽  
K. L. Wang
Keyword(s):  
Activation Energy ◽  
Raman Scattering ◽  
Vacancy Mechanism ◽  
Strained Si ◽  
X Ray ◽  
Scattering Measurements ◽  
Intensity Changes ◽  
Interface Mixing ◽  
Interdiffusion Coefficients

ABSTRACTInterface mixing between the Ge and Si layers in symmetrically strained SimGem superlattices occurs during post growth thermal anneals. Interdiffusion coefficients were obtained from intensity changes in the low angle superlattice x-ray satellites on samples with nominal periodicities between 1.4nm and 5.6nm. A common activation energy of 3.0±0.1 eV was found. The bulk interdiffusion coefficients for SimGem were derived since measurements were made on samples with different layer thicknesses. Intermixing appears to occur by diffusion of Si atoms into the Ge layers via a vacancy mechanism. Raman scattering measurements support this process as well as the formation of Si1−xGex, alloy layers during the anneals.

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

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