A Metamaterial for Next Generation Particle Accelerators

Physics ◽  
2019 ◽  
Vol 11 ◽  
Author(s):  
Patric Muggli
Keyword(s):  
Particle Accelerators ◽  
Next Generation

Reducing field emission in superconducting RF cavities for the next generation of particle accelerators

1991 ◽  
Vol 27 (2) ◽  
pp. 1935-1939
Author(s):  
Q.S. Shu ◽  
W. Hartung ◽  
A. Leibovich ◽  
J. Kirchgessner ◽  
D. Moffat ◽  
...  
Keyword(s):  
Field Emission ◽  
Particle Accelerators ◽  
Next Generation ◽  
Rf Cavities ◽  
Superconducting Rf

scholarly journals A Fast Readout Electronic System for Accurate Spatial Detection in Ion Beam Tracking for the Next Generation of Particle Accelerators

2015 ◽  
Vol 64 (2) ◽  
pp. 318-327 ◽  
Author(s):  
Alejandro Garzon-Camacho ◽  
Begona Fernandez ◽  
Marcos A. G. Alvarez ◽  
Joaquin Ceballos ◽  
Jos M. de la Rosa
Keyword(s):  
Ion Beam ◽  
Electronic System ◽  
Particle Accelerators ◽  
Next Generation ◽  
Readout Electronic ◽  
Beam Tracking ◽  
Spatial Detection

scholarly journals A mechanism of Cu work function reduction in CsBr/Cu photocathodes

2016 ◽  
Vol 18 (10) ◽  
pp. 7427-7434
Author(s):  
M. T. E. Halliday ◽  
W. P. Hess ◽  
A. L. Shluger
Keyword(s):  
Thin Films ◽  
Work Function ◽  
Free Electron ◽  
Particle Accelerators ◽  
Free Electron Lasers ◽  
Next Generation

Thin films of CsBr deposited on Cu(100) have been proposed as next-generation photocathode materials for applications in particle accelerators and free-electron lasers.

Specimen Preparation of Near Surface Ion Irradiated Samples

1985 ◽  
Vol 43 ◽  
pp. 170-171
Author(s):  
K. F. Russell ◽  
L. L. Horton
Keyword(s):  
Radiation Damage ◽  
Heavy Ions ◽  
Target Material ◽  
Metal Alloys ◽  
Specimen Surface ◽  
Specimen Preparation ◽  
Particle Accelerators ◽  
Near Surface ◽  
Graaff Accelerator ◽  
Van De Graaff

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.

1477: Durability of Next Generation Flexible Ureteroscopes: Randomized Prospective Study

2004 ◽  
Vol 171 (4S) ◽  
pp. 389-389
Author(s):  
Manoj Monga ◽  
Ramakrishna Venkatesh ◽  
Sara Best ◽  
Caroline D. Ames ◽  
Courtney Lee ◽  
...  
Keyword(s):  
Prospective Study ◽  
Next Generation ◽  
Flexible Ureteroscopes
Sign in / Sign up

Export Citation Format

Share Document