scholarly journals Microtexture Studies of PST and PZT Ceramics and PZT Thin Film by Electron Backscatter Diffraction Patterns

2002 ◽  
Vol 35 (2) ◽  
pp. 71-86 ◽  
Author(s):  
C. W. Tai ◽  
K. Z. Baba-Kishi
Keyword(s):  
Thin Film ◽  
Lead Zirconate Titanate ◽  
Electron Backscatter Diffraction ◽  
Lead Zirconate ◽  
Ferroelectric Material ◽  
Pzt Ceramics ◽  
Pzt Thin Film ◽  
Electron Backscatter ◽  
Diffraction Patterns ◽  
Backscatter Diffraction

Crystallographic orientations of twelve different lead scandium tantalate (PST) ceramics, two lead zirconate titanate ceramics (PZT) and one PZT thin film were investigated by the technique of electron backscatter diffraction (EBSD) in the scanning electron microscope. The PST ceramics were processed under different conditions of temperature and annealing. Crystal orientations in the bulk ceramics were examined and the results were plotted in microtexture pole- and inverse pole-figures. Local texture and misorientation between adjacent grains in certain selected regions of the ceramics were also examined. To compare the results of the PST with another lead-based ferroelectric material, an unpoled and a poled PZT ceramics were studied for their texture. The electrical and electromechanical properties of the PZT ceramics were also measured in an attempt to correlate texture with properties. Extensive studies revealed insignificant texture in the ceramics, indicating no relationship between ferroelectricity and texture. Preferred orientations were observed in a PZT thin film grown by pulsed-laser deposition (PLD) method. Though improved anisotropy in PZT thin films can be attributed to texture, there is no indication of the dependence of piezoelectricity on texture.

Correlations Among Degradations in Lead Zirconate Titanate thin Film Capacitors

1993 ◽  
Vol 310 ◽  
Author(s):  
In K. Yoo ◽  
Seshu B. Desu ◽  
Jimmy Xing
Keyword(s):  
Thin Film ◽  
Leakage Current ◽  
Lead Zirconate Titanate ◽  
Oxygen Vacancies ◽  
Lead Zirconate ◽  
Electrical Degradation ◽  
Zirconate Titanate ◽  
Thin Film Capacitors ◽  
Pzt Thin Film ◽  
Degradation Properties

AbstractMany attempts have been made to reduce degradation properties of Lead Zirconate Titanate (PZT) thin film capacitors. Although each degradation property has been studied extensively for the sake of material improvement, it is desired that they be understood in a unified manner in order to reduce degradation properties simultaneously. This can be achieved if a common source(s) of degradations is identified and controlled. In the past it was noticed that oxygen vacancies play a key role in fatigue, leakage current, and electrical degradation/breakdown of PZT films. It is now known that space charges (oxygen vacancies, mainly) affect ageing, too. Therefore, a quantitative ageing mechanism is proposed based on oxygen vacancy migration under internal field generated by either remanent polarization or spontaneous polarization. Fatigue, leakage current, electrical degradation, and polarization reversal mechanisms are correlated with the ageing mechanism in order to establish guidelines for simultaneous degradation control of PZT thin film capacitors. In addition, the current pitfalls in the ferroelectric test circuit is discussed, which may cause false retention, imprint, and ageing.

scholarly journals Crystal orientation and detector distance effects on resolving pseudosymmetry by electron backscatter diffraction

2021 ◽  
Vol 54 (2) ◽  
pp. 513-522
Author(s):  
Edward L. Pang ◽  
Christopher A. Schuh
Keyword(s):  
Crystal Orientation ◽  
Electron Backscatter Diffraction ◽  
Detector Distance ◽  
Recent Emergence ◽  
Distance Effects ◽  
Electron Backscatter ◽  
Sample Position ◽  
Position And Orientation ◽  
Diffraction Patterns ◽  
Backscatter Diffraction

Accurately indexing pseudosymmetric materials has long proven challenging for electron backscatter diffraction. The recent emergence of intensity-based indexing approaches promises an enhanced ability to resolve pseudosymmetry compared with traditional Hough-based indexing approaches. However, little work has been done to understand the effects of sample position and orientation on the ability to resolve pseudosymmetry, especially for intensity-based indexing approaches. Thus, in this work the effects of crystal orientation and detector distance in a model tetragonal ZrO2 (c/a = 1.0185) material are quantitatively investigated. The orientations that are easiest and most difficult to correctly index are identified, the effect of detector distance on indexing confidence is characterized, and these trends are analyzed on the basis of the appearance of specific zone axes in the diffraction patterns. The findings also point to the clear benefit of shorter detector distances for resolving pseudosymmetry using intensity-based indexing approaches.

Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique

2015 ◽  
Vol 48 (3) ◽  
pp. 797-813 ◽  
Author(s):  
Farangis Ram ◽  
Stefan Zaefferer ◽  
Tom Jäpel ◽  
Dierk Raabe
Keyword(s):  
Electron Diffraction ◽  
Electron Backscatter Diffraction ◽  
Diffraction Theory ◽  
Classical Electron ◽  
Accuracy Measure ◽  
Electron Backscatter ◽  
Analytical Accuracy ◽  
Precision And Accuracy ◽  
Diffraction Patterns ◽  
Backscatter Diffraction

The fidelity – that is, the error, precision and accuracy – of the crystallographic orientations and disorientations obtained by the classical two-dimensional Hough-transform-based analysis of electron backscatter diffraction patterns (EBSPs) is studied. Using EBSPs simulated based on the dynamical electron diffraction theory, the fidelity analysis that has been previously performed using the patterns simulated based on the theory of kinematic electron diffraction is improved. Using the same patterns, the efficacy of a Fisher-distribution-based analytical accuracy measure for orientation and disorientation is verified.

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