scholarly journals Thermal Electron Attachment to SF6 and CFCl3

1983 ◽  
Vol 36 (1) ◽  
pp. 15 ◽  
Author(s):  
RW Crompton ◽  
GN Haddad

Measurements of the attachment rate for thermal electrons to SF6 and CFCI3 have been made using the Cavalieri electron-density sampling technique. The largest single source of error was shown to be uncertainty in the composition of the gas mixtures used in the experiments which contained < 10 ppm of the attaching gases. By paying special attention to this problem, the overall uncertainty in the attachment rates was reduced to less than � 3 %.

2009 ◽  
Vol 80 (3) ◽  
pp. 034104 ◽  
Author(s):  
Thomas M. Miller ◽  
Jeffrey F. Friedman ◽  
John S. Williamson ◽  
Linda C. Schaffer ◽  
A. A. Viggiano

2005 ◽  
Vol 35 (2) ◽  
pp. 307-312 ◽  
Author(s):  
C. A. Mayhew ◽  
A. D.J. Critchley ◽  
D. C. Howse ◽  
V. Mikhailov ◽  
M. A. Parkes

1988 ◽  
Vol 41 (9) ◽  
pp. 1491 ◽  
Author(s):  
J Sherwell ◽  
R Cooper ◽  
DC Nguyen ◽  
SP Mezyk

A new technique involving a combination of microwave absorption techniques and pulse radiolysis has been used to monitor electron processes in irradiated gases. The thermal electron attachment rate constants of various halogen-containing molecules have been measured and compared with the available literature values. The adaption of this technique for the measurement of electron-ion recombination rate constants and thermalization times for these gases is discussed.


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