A simple method for depth determination from self-potential anomalies due to two superimposed structures
2004 ◽
Vol 161
(2)
◽
pp. 399-411
◽
Keyword(s):
1978 ◽
Vol 36
(1)
◽
pp. 226-227
1981 ◽
Vol 39
◽
pp. 550-551
Keyword(s):
2002 ◽
Vol 52
(2)
◽
pp. 49-56
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