Advances in the Application of Array Detectors for Improved Chemical Analysis. Part 2. Rapid Trace Metal Analysis of High Solids Wastewater and Sludge Using a Direct Current Plasma Source Equipped with an Echelle Spectrometer and a Charge-Injection Device Detector

ChemInform ◽  
2003 ◽  
Vol 34 (28) ◽  
Author(s):  
Jeff Prevatt ◽  
M. Bonner Denton
Keyword(s):  
Chemical Analysis ◽  
Plasma Source ◽  
High Solids ◽  
Injection Device ◽  
Metal Analysis ◽  
Trace Metal Analysis ◽  
Array Detectors ◽  
Direct Current Plasma ◽  
A Charge ◽  
Echelle Spectrometer

Advances in the Application of Array Detectors for Improved Chemical Analysis, Part II. Rapid Trace Metal Analysis of High Solids Wastewater and Sludge Using a Direct Current Plasma Source Equipped with an Echelle Spectrometer and a Charge-Injection Device Detector

2003 ◽  
Vol 56 (3) ◽  
pp. 133 ◽  
Author(s):  
Jeff Prevatt ◽  
M. Bonner Denton
Keyword(s):  
Trace Metals ◽  
Direct Current ◽  
Charge Injection ◽  
Plasma Source ◽  
High Solids ◽  
Injection Device ◽  
Analytical Technique ◽  
Array Detectors ◽  
Direct Current Plasma ◽  
Echelle Spectrometer

A direct current plasma (DCP) source, equipped with an echelle spectrometer and charge-injection device (CID) detector, was employed for the analysis of trace metals in municipal sludge and wastewater containing high solids. The use of DCP as a plasma source has largely vanished in the past decade due to the popularity of inductively coupled plasma. Resurrecting this robust plasma source and coupling it to a state-of-the-art echelle spectrometer provides for an extremely forgiving analytical technique capable of analysing trace metals rapidly, even in complex high-solid matrices. Instrument performance is further enhanced as the echelle/CID spectrometer provides a simultaneous multi-element fingerprint of contaminants in the waste. The improved design offers increased sensitivity in the far ultraviolet, with overall wavelength coverage from 175 to 800 nm. Furthermore, multi-element analysis is obtained quickly with minimal or no sample preparation, making this the fastest screening technique available.

Elemental Analysis with a Plasma Emission Echelle Spectrometer Employing a Charge Injection Device (CID) Detector

1989 ◽  
Vol 43 (1) ◽  
pp. 1-11 ◽  
Author(s):  
R. B. Bilhorn ◽  
M. B. Denton
Keyword(s):  
Elemental Analysis ◽  
Dynamic Range ◽  
Charge Injection ◽  
Emission Spectra ◽  
Atomic Emission ◽  
Plasma Emission ◽  
Injection Device ◽  
Qualitative Comparison ◽  
A Charge ◽  
Echelle Spectrometer

An atomic emission spectrometer which allows simultaneous high-precision digital recording of the ultraviolet spectrum has been developed. The instrument employs both a custom-built echelle spectrometer and a custom-built slow-scan charge injection device (CID) based detector system. The system is capable of measuring the wide dynamic range of signal intensities associated with plasma emission sources, and sensitivity is comparable to that of photomultiplier-tube-equipped instruments. Unprecedented speed and flexibility for elemental analysis are provided by the ability to display background-subtracted emission spectra and to have the computer assist in spectral line identification. The design and performance of the optical system, methodologies for CID detector utilization in analytical spectroscopy, and techniques for wavelength calibration are presented. Examples for qualitative analysis and for the qualitative comparison of similar samples demonstrate the sensitivity, flexibility, and speed of the system.

TRACE METAL ANALYSIS IN LONG ISLAND MARSH CORES

2020 ◽  
Author(s):  
Moread Achek ◽  
◽  
E. Christa Farmer ◽  
Brandon Buchbinder ◽  
Joyce Bowen ◽  
...  
Keyword(s):  
Trace Metal ◽  
Long Island ◽  
Metal Analysis ◽  
Trace Metal Analysis

Derivative-Fourier transforms-polynomial fit: a coupling of interest in common non-ideal cases arises during trace metal analysis using graphite furnace atomic absorption spectrometry

RSC Advances ◽  
2015 ◽  
Vol 5 (59) ◽  
pp. 47866-47875 ◽  
Author(s):  
Mohamed A. Korany ◽  
Hesham. Z. Ibrahim ◽  
Marwa A. A. Ragab ◽  
Mervat A. Abdel-Kawi ◽  
Abd El Aal A. A. Sayed
Keyword(s):  
Trace Metal ◽  
Atomic Absorption ◽  
Fourier Transforms ◽  
Graphite Furnace ◽  
Absorption Spectrometry ◽  
Metal Analysis ◽  
Trace Metal Analysis ◽  
Polynomial Fit ◽  
Graphite Furnace Atomic Absorption ◽  
Chemometric Treatment

Chemometric treatment was proposed for handling graphite furnace atomic absorption (GFAAS) data.

scholarly journals Disposable microfabricated bismuth microelectrode arrays for trace metal analysis by stripping voltammetry

2011 ◽  
Vol 25 ◽  
pp. 880-883 ◽  
Author(s):  
Christos Kokkinos ◽  
Anastasios Economou ◽  
Ioannis Raptis ◽  
Thanassis Speliotis
Keyword(s):  
Trace Metal ◽  
Microelectrode Arrays ◽  
Stripping Voltammetry ◽  
Metal Analysis ◽  
Trace Metal Analysis

Gamma induced dose fluctuations in a charge injection device

1988 ◽  
Vol 35 (6) ◽  
pp. 1302-1306 ◽  
Author(s):  
E.A. Burke ◽  
G.E. Bender ◽  
J.K. Pimbley ◽  
G.P. Summers ◽  
C.J. Dale ◽  
...  
Keyword(s):  
Charge Injection ◽  
Injection Device ◽  
A Charge
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