Scanning Microscope Observations of the Pigment Strand in the Caryopsis of Wheat

1975 ◽  
Vol 23 (1) ◽  
pp. 107 ◽  
Author(s):  
S Zee
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Structural Features ◽  
Scanning Microscope ◽  
Pigment Strand ◽  
Scanning Electron

Structural features of the tissues of the pigment strand in the caryopsis of wheat were studied by means of the scanning electron microscope.

Features of the architectonics of the microstructure of the primary remex of Owls (Strigiformes) due to the specifics of the flight

2021 ◽  
Vol 66 (2) ◽  
pp. 232-246
Author(s):  
E. O. Fadeeva
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Cross Section ◽  
Dorsal Surface ◽  
Structural Features ◽  
Electron Microscopic Investigation ◽  
Original Research ◽  
Electron Microscopic ◽  
Microstructural Characteristics ◽  
Scanning Electron

Conducted electron microscopic investigation of the primary remex fine structure of thirteen species of Owls (Strigiformes), using a scanning electron microscope (SEM). It is shown that Owls (Strigiformes) have a number of specific primary remex microstructural characteristics. First of all, these are the features of the structure of the pennaceous barb: a cross section configuration, a pith architectonics on the cross section and longitudinal sections, a cuticular structur of the barb. A number of the unique features in the microstructure of the vanules of the pennaceous barb have been found for the first time (at the scanning electron microscope level, at a large SEM magnification). First of all, these are the structural features of the distal barbules and the structure of the apical portion of the barb with the elongated proximal barbules and the distal barbules tightly contiguous to the ramus and closed with each other. Mentioned characteristics make for the thick velvet-like dorsal surface of the vane and the presence of a complex of peculiar “bunches” (fringes) forming the cleft edge (a fringed edge) of the inner vane – exceptionally specific adaptive characteristics in Strigiformes. Рresentenced original research results suggest that Owls (Strigiformes) have a number specific microstructural characteristics of the primary remex and also a number of the unique features in the microstructure of the primary remex which reflecting the ecological and morphological adaptations conditioned by the flight specificity.

scholarly journals CONTROL OF CHEMICAL COMPOSITION OF CASTING BRASS IN INGOTS USED FOR MANUFACTURE OF STOP VALVES

2017 ◽  
pp. 49-53
Author(s):  
A. A. Pivovarchyk ◽  
Е. V. Pivovarchyk
Keyword(s):  
Electron Microscope ◽  
Chemical Composition ◽  
Scanning Electron Microscope ◽  
Optical Emission ◽  
Technological Properties ◽  
Scanning Microscope ◽  
Scanning Electron

The article presents the results of a research of the chemical composition of brass foundry grade LS, supplied by domestic and foreign producers, as well as the chemical composition of brass lead grade LC4C used for the manufacture of stop valves. The research was made with use of optical emission spectrometers of various models and a scanning microscope. It was established that the pig delivered by the domestic producers corresponds to parameters of chemical composition for the pig’s foundry brand LS, while in the pig supplied by foreign producers there were found disparities of the chemical composition of certain basic elements. The results of the studies showed that the pig supplied by all producers, as well as the melt obtained with its use, contain in its composition such harmful impurities as S, Bi and P in the amount of 0.001%, 0.0017% and 0.0045%, respectively, that can lead to a decrease in the technological properties of products. It has been established that the use of ARL 3460 and OBLF-QSW 750 emission spectrometers and the Tescan VEGA II LMU scanning electron microscope makes it possible to obtain practically identical values of the content of the main elements and impurities in pigs of foundry and brass lead grade LC40C in studies on determining the chemical composition of the materials under study. 

Applications of the Scanning Electron Microscope on Active Semiconductor Devices

1970 ◽  
Vol 28 ◽  
pp. 378-379 ◽  
Author(s):  
Robert D. Dobrott
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Semiconductor Devices ◽  
Electrical Potential ◽  
Electrical Characteristics ◽  
Scanning Microscope ◽  
Bulk Properties ◽  
Potential Gradients ◽  
Non Destructive ◽  
Scanning Electron

The scanning electron microscope is rapidly becoming an extremely powerful tool for studying active semiconductor devices. This tool gives an essentially non-destructive means of studying both the bulk and surface electrical characteristics of the device under high magnification. The mapping of electrical potential gradients on the surface of a device under bias is a valuable aid in reliability prediction as well as failure anal-sis of completely non-working or marginally operating devices. Bulk properties (i.e. p-n or isolation junctions) can be studied in the scanning microscope using the specimen conductive mode. This paper will be restricted to the surface potential gradients using the emissive mode(secondary electron signal) for image display.

Performance Characteristics of the Nondispersive X-ray Spectrometer

1969 ◽  
Vol 27 ◽  
pp. 92-93
Author(s):  
J. C. Russ
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Performance Characteristics ◽  
Energy Dispersive ◽  
Scanning Microscope ◽  
X Ray ◽  
Recent Introduction ◽  
Scanning Electron

With the relatively recent introduction of nondispersive (or energy dispersive) xray spectrometers for the scanning electron microscope, there has been much interest on the part of users because this type spectrometer lends itself well to the scanning microscope and consequently there is brisk competition among the various suppliers of these devices. It is necessary for the user to have some working understanding of this type spectrometer as it is quite different from the conventional dispersive spectrometer commonly used on microprobes.

An Electron Gun Scanning Microscope

1968 ◽  
Vol 26 ◽  
pp. 360-361
Author(s):  
A. V. Crewe ◽  
D. Johnson ◽  
M. Isaacson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Beam Current ◽  
Angular Spread ◽  
Electron Gun ◽  
Emission Current ◽  
Scanning Microscope ◽  
Schematic Drawing ◽  
Scanning Electron

A simple scanning electron microscope has been built using a field emission electron gun. The gun is used alone, without the aid of auxiliary lenses, and is theoretically capable of producing a 100 Å probe with a beam current of 10-10 A. Such a beam current allows scan times of the order of a few seconds.A schematic drawing of the microscope is shown in Fig. 2. The field emission voltage is applied to the first anode which controls the emission current. An accelerating voltage is applied to the second anode, and the field between the anodes focuses the electrons to form an image of the tip at the specimen. The angular spread of the beam is limited by an aperture on the second anode.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

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