scholarly journals Multiframe point-projection radiography imaging based on hybrid X-pinch

2021 ◽  
Vol 92 (12) ◽  
pp. 123505
Author(s):  
I. N. Tilikin ◽  
T. A. Shelkovenko ◽  
S. A. Pikuz ◽  
S. N. Bland
Keyword(s):  
Projection Radiography ◽  
Point Projection

scholarly journals Studying of Explosive Electron Emission From “Whisker” Cathode Using X-Ray Point-Projection Radiography

2018 ◽  
Vol 46 (11) ◽  
pp. 3815-3819
Author(s):  
Sergey A. Pikuz ◽  
Tatiana A. Shelkovenko ◽  
Ivan N. Tilikin ◽  
Egor V. Parkevich ◽  
Albert R. Mingaleev ◽  
...  
Keyword(s):  
Electron Emission ◽  
X Ray ◽  
Projection Radiography ◽  
Explosive Electron Emission ◽  
Point Projection

Applications of point-projection radiography to high energy density physics experiments

2010 ◽  
Vol 22 (10) ◽  
pp. 2345-2348
Author(s):  
董佳钦 Dong Jiaqin ◽  
傅思祖 Fu Sizu ◽  
王伟 Wang Wei ◽  
熊俊 Xiong Jun ◽  
贾果 Jia Guo ◽  
...  
Keyword(s):  
Energy Density ◽  
High Energy ◽  
High Energy Density ◽  
High Energy Density Physics ◽  
Projection Radiography ◽  
Point Projection ◽  
Physics Experiments

Investigation of Carbon $X$-Pinches as a Source for Point-Projection Radiography

2009 ◽  
Vol 37 (3) ◽  
pp. 433-437 ◽  
Author(s):  
R.E. Madden ◽  
S.C. Bott ◽  
G.W. Collins ◽  
F.N. Beg
Keyword(s):  
Projection Radiography ◽  
Point Projection

Point projection radiography with the flexible x-ray imager

1997 ◽  
Vol 68 (1) ◽  
pp. 796-798 ◽  
Author(s):  
K. S. Budil ◽  
T. S. Perry ◽  
S. A. Alvarez ◽  
D. Hargrove ◽  
J. R. Mazuch ◽  
...  
Keyword(s):  
X Ray ◽  
Projection Radiography ◽  
Point Projection

The X pinch as an x-ray source for point-projection radiography

2005 ◽  
Author(s):  
S. A. Pikuz ◽  
T. A. Shelkovenko ◽  
A. R. Mingaleev ◽  
V. M. Romanova ◽  
B. M. Song ◽  
...  
Keyword(s):  
X Ray ◽  
Projection Radiography ◽  
Point Projection

Low-energy point-reflection EM

1995 ◽  
Vol 53 ◽  
pp. 610-611
Author(s):  
J. C. H. Spence ◽  
X. Zhang ◽  
J. M. Zuo ◽  
U. Weierstall ◽  
E. Munro ◽  
...  
Keyword(s):  
Low Voltage ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Experimental Point ◽  
Crystalline Substrate ◽  
Point Reflection ◽  
Reflection Geometry ◽  
Optical Analog ◽  
Point Projection ◽  
Atomically Flat

The limited penetration of the low-voltage point-projection microscope (PPM) may be avoided by using the reflection geometry to image clean surfaces in ultra-high vacuum. Figure 1 shows the geometry we are using for experimental point-reflection (PRM) imaging. A nanotip field-emitter at about 100 - 1000 volts is placed above a grounded atomically flat crystalline substrate, which acts as a mirror and anode. Since most of the potential is dropped very close to the tip, trajectories are reasonably straight if the sample is in the far-field of the tip. A resolution of 10 nm is sought initially. The specular divergent RHEED beam then defines a virtual source S' below the surface, resulting in an equivalent arrangement to PPM (or defocused CBED). Shadow images of surface asperities are then expected on the distant detector, out of focus by the tip-to-sample distance. These images can be interpreted as in-line electron holograms and so reconstructed (see X. Zhang et al, these proceedings). Optical analog experiments confirm the absence of foreshortening when the detector is parallel to the surface.

Fresnel interference in point-projection imaging of purple membrane

1995 ◽  
Vol 53 ◽  
pp. 846-847
Author(s):  
X. Zhang ◽  
J. Spence ◽  
W. Qian ◽  
D. Taylor ◽  
K. Taylor
Keyword(s):  
Detection Efficiency ◽  
Mean Free Path ◽  
Purple Membrane ◽  
Unit Cell Dimension ◽  
Experimental Point ◽  
Membrane Thickness ◽  
Low Energies ◽  
Channel Plate ◽  
Point Projection ◽  
Inelastic Mean Free Path

Experimental point-projection shadow microscope (PPM) images of uncoated, unstained purple membrane (PM, bacteriorhodopsin, a membrane protein from Halobacterium holobium) were obtained recently using 100 volt electrons. The membrane thickness is about 5 nm and the hexagonal unit cell dimension 6 nm. The images show contrast around the edges of small holes, as shown in figure 1. The interior of the film is opaque. Since the inelastic mean free path for 100V electrons in carbon (about 6 Å) is much less than the sample thickness, the question arises that how much, if any, transmission of elastically scattered electrons occurs. A large inelastic contribution is also expected, attenuated by the reduced detection efficiency of the channel plate at low energies. Quantitative experiments using an energy-loss spectrometer are planned. Recently Shedd has shown that at about 100V contrast in PPM images of thin gold films can be explained as Fresnel interference effects between different pinholes in the film, separated by less than the coherence width.

Intravenous Angiography Using Scanned Projection Radiography: Preliminary Investigation of a New Method

1980 ◽  
Vol 15 (3) ◽  
pp. 220-223 ◽  
Author(s):  
WILLIAM R. BRODY ◽  
ALBERT MACOVSKI ◽  
LEONARD LEHMANN ◽  
FRANK A. DiBIANCA ◽  
DONALD VOLZ ◽  
...  
Keyword(s):  
Preliminary Investigation ◽  
New Method ◽  
Projection Radiography ◽  
Intravenous Angiography
Sign in / Sign up

Export Citation Format

Share Document