Electronic structure of epitaxially grown and regrown GaN pn junctions characterized by scanning Kelvin probe and capacitance microscopy

Tae-Hyeon Kim; Kai Fu; Chen Yang; Yuji Zhao; Edward T. Yu

doi:10.1063/5.0071422

Electronic structure of epitaxially grown and regrown GaN pn junctions characterized by scanning Kelvin probe and capacitance microscopy

Journal of Applied Physics ◽

10.1063/5.0071422 ◽

2022 ◽

Vol 131 (1) ◽

pp. 015704

Author(s):

Tae-Hyeon Kim ◽

Kai Fu ◽

Chen Yang ◽

Yuji Zhao ◽

Edward T. Yu

Keyword(s):

Electronic Structure ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Pn Junctions

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Scanning Kelvin probe microscopy of surface electronic structure in GaN grown by hydride vapor phase epitaxy

Journal of Applied Physics ◽

10.1063/1.1481208 ◽

2002 ◽

Vol 91 (12) ◽

pp. 9924 ◽

Cited By ~ 37

Author(s):

B. S. Simpkins ◽

D. M. Schaadt ◽

E. T. Yu ◽

R. J. Molnar

Keyword(s):

Electronic Structure ◽

Vapor Phase ◽

Vapor Phase Epitaxy ◽

Hydride Vapor Phase Epitaxy ◽

Kelvin Probe ◽

Probe Microscopy ◽

Kelvin Probe Microscopy ◽

Surface Electronic Structure ◽

Scanning Kelvin Probe

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Quantitative calibration of the relationship between Volta potential measured by scanning Kelvin probe force microscope (SKPFM) and hydrogen concentration

Electrochimica Acta ◽

10.1016/j.electacta.2020.137422 ◽

2021 ◽

Vol 366 ◽

pp. 137422

Author(s):

Zhaoxiang Ma ◽

Xilin Xiong ◽

Lin Chen ◽

Yanjing Su

Keyword(s):

Hydrogen Concentration ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Volta Potential ◽

The Relationship

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Scanning Kelvin probe measurements on As-doped CdTe solar cells

Semiconductor Science and Technology ◽

10.1088/0268-1242/28/10/105024 ◽

2013 ◽

Vol 28 (10) ◽

pp. 105024 ◽

Cited By ~ 8

Author(s):

W S M Brooks ◽

S J C Irvine ◽

D M Taylor

Keyword(s):

Solar Cells ◽

Kelvin Probe ◽

Cdte Solar Cells ◽

Scanning Kelvin Probe ◽

Probe Measurements

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Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging

The Journal of Physical Chemistry C ◽

10.1021/jp1056607 ◽

2010 ◽

Vol 114 (48) ◽

pp. 20672-20677 ◽

Cited By ~ 42

Author(s):

Obadiah G. Reid ◽

Glennis E. Rayermann ◽

David C. Coffey ◽

David S. Ginger

Keyword(s):

Solar Cells ◽

Conjugated Polymer ◽

Electrostatic Force ◽

Polymer Solar Cells ◽

Electrostatic Force Microscopy ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Trap Formation ◽

Scanning Kelvin Probe

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In situ infrared spectroscopic and scanning Kelvin probe measurements of water and ion transport at polymer/metal interfaces

Electrochimica Acta ◽

10.1016/j.electacta.2005.09.024 ◽

2006 ◽

Vol 51 (16) ◽

pp. 3303-3315 ◽

Cited By ~ 54

Author(s):

K. Wapner ◽

M. Stratmann ◽

G. Grundmeier

Keyword(s):

Ion Transport ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Infrared Spectroscopic ◽

Polymer Metal ◽

Metal Interfaces ◽

Water And Ion Transport ◽

Probe Measurements

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Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheet

Electrochimica Acta ◽

10.1016/j.electacta.2012.10.051 ◽

2013 ◽

Vol 88 ◽

pp. 330-339 ◽

Cited By ~ 26

Author(s):

F. Norouzi Afshar ◽

J.H.W. de Wit ◽

H. Terryn ◽

J.M.C. Mol

Keyword(s):

Al Alloys ◽

Kelvin Probe Force Microscopy ◽

Electrochemical Characteristics ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Photoreduction Altered Work Function of Au–TiO2 Nanoparticles Measured by Scanning Kelvin Probe Microscopy

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2013.7932 ◽

2013 ◽

Vol 13 (12) ◽

pp. 8217-8223 ◽

Cited By ~ 12

Author(s):

Arun S. Patel ◽

Avesh Kumar ◽

T. Mohanty

Keyword(s):

Work Function ◽

Kelvin Probe ◽

Probe Microscopy ◽

Kelvin Probe Microscopy ◽

Scanning Kelvin Probe

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Hydrogen diffusion and trapping in a low copper 7xxx aluminium alloy investigated by Scanning Kelvin Probe Force Microscopy

Materials Science and Engineering A ◽

10.1016/j.msea.2017.08.119 ◽

2017 ◽

Vol 706 ◽

pp. 126-135 ◽

Cited By ~ 16

Author(s):

Loïc Oger ◽

Manon Chloé Lafouresse ◽

Grégory Odemer ◽

Lionel Peguet ◽

Christine Blanc

Keyword(s):

Aluminium Alloy ◽

Hydrogen Diffusion ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Influence of film structure and light on charge trapping and dissipation dynamics in spun-cast organic thin-film transistors measured by scanning Kelvin probe microscopy

Applied Physics Letters ◽

10.1063/1.4720063 ◽

2012 ◽

Vol 100 (26) ◽

pp. 263305 ◽

Cited By ~ 3

Author(s):

L. C. Teague ◽

M. A. Loth ◽

J. E. Anthony

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Charge Trapping ◽

Film Structure ◽

Organic Thin Film Transistors ◽

Organic Thin Film ◽

Kelvin Probe ◽

Probe Microscopy ◽

Kelvin Probe Microscopy ◽

Scanning Kelvin Probe

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