A differential thin film resistance thermometry method for peak thermal conductivity measurements of high thermal conductivity crystals

2021 ◽  
Vol 92 (9) ◽  
pp. 094901
Author(s):  
Yuanyuan Zhou ◽  
Chunhua Li ◽  
David Broido ◽  
Li Shi
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
High Thermal Conductivity ◽  
Film Resistance ◽  
Conductivity Measurements ◽  
Resistance Thermometry

Chemical-Vapor-Deposited Materials for High Thermal Conductivity Applications

MRS Bulletin ◽  
2001 ◽  
Vol 26 (6) ◽  
pp. 458-463 ◽  
Author(s):  
Jitendra S. Goela ◽  
Nathaniel E. Brese ◽  
Michael A. Pickering ◽  
John E. Graebner
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
High Thermal Conductivity ◽  
Solid Materials ◽  
Chemical Vapor Deposited

Chemical vapor deposition (CVD) is an attractive method for producing bulk and thin-film materials for a variety of applications. In this method, gaseous reagents condense onto a substrate and then react to produce solid materials. The materials produced by CVD are theoretically dense, highly pure, and have other superior properties.

scholarly journals Thin-Film Thermal Conductivity Measurements Using Superconducting Nanowires

2018 ◽  
Vol 193 (3-4) ◽  
pp. 380-386 ◽  
Author(s):  
J. P. Allmaras ◽  
A. G. Kozorezov ◽  
A. D. Beyer ◽  
F. Marsili ◽  
R. M. Briggs ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Conductivity Measurements ◽  
Superconducting Nanowires

Characterisation of high thermal conductivity thin-film substrate systems and their interface thermal resistance

2018 ◽  
Vol 334 ◽  
pp. 233-242 ◽  
Author(s):  
Alireza Moridi ◽  
Liangchi Zhang ◽  
Weidong Liu ◽  
Steven Duvall ◽  
Andrew Brawley ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Thermal Resistance ◽  
High Thermal Conductivity ◽  
Interface Thermal Resistance ◽  
Film Substrate

411 In-Plane Thermal Conductivity and Electrical Conductivity Measurements of Silicon Thin Film

2012 ◽  
Vol 2012.65 (0) ◽  
pp. 139-140
Author(s):  
Harutoshi HAGINO ◽  
Yosuke KAWAHARA ◽  
Aimi GOTO ◽  
Toru HIWADA ◽  
Koji Miyazaki
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Electrical Conductivity ◽  
Conductivity Measurements ◽  
Silicon Thin Film

Thermal conductivity measurements of thin-film resist

2001 ◽  
Vol 19 (6) ◽  
pp. 2874 ◽  
Author(s):  
Dachen Chu ◽  
Maxat Touzelbaev ◽  
Kenneth E. Goodson ◽  
Sergey Babin ◽  
R. Fabian Pease
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Conductivity Measurements

Workshop on thin film thermal conductivity measurements

1998 ◽  
Author(s):  
Albert Feldman ◽  
Naira M. Balzaretti ◽  
Arthur H. Guenther
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Conductivity Measurements

Application of the ASTM D5470 standard test method for thermal conductivity measurements of high thermal conductive materials

2019 ◽  
Vol 2 (95) ◽  
pp. 57-63 ◽  
Author(s):  
Z. Buliński ◽  
S. Pawlak ◽  
T. Krysiński ◽  
W. Adamczyk ◽  
R. Białecki
Keyword(s):  
Thermal Conductivity ◽  
Heat Flux ◽  
Temperature Drop ◽  
High Accuracy ◽  
Standard Test ◽  
Test Method ◽  
High Thermal Conductivity ◽  
Conductivity Measurements ◽  
Conductive Materials ◽  
Standard Test Method

Purpose: The purpose of the present study was to demonstrate the procedure for determining the thermal conductivity of a solid material with relatively high thermal conductivity, using an original self-designed apparatus. Design/methodology/approach: The thermal conductivity measurements have been performed according to the ASTM D5470 standard. The thermal conductivity was calculated from the recorded temperature values in steady-state heat transfer conditions and determined heat flux. Findings: It has been found from the obtained experimental results that the applied standard test method, which was initially introduced for thermal conductivity measurements of thermal interface materials (TIMs), is also suitable for materials with high thermal conductivity, giving reliable results. Research limitations/implications: The ASTM D5470 standard test method for measurement of thermal conductivity usually gives poor results for high conductive materials having thermal conductivity above 100 W/mK, due to problems with measuring heat flux and temperature drop across the investigated sample with reasonably high accuracy. Practical implications: The results obtained for the tested material show that the presented standard test method can also be used for materials with high thermal conductivity, which is of importance either for the industrial or laboratory applications. Originality/value: The thermal conductivity measurements have been carried out using an original self-designed apparatus, which was developed for testing broad range of engineering materials with high accuracy.

Thin-film aerogel thermal conductivity measurements via 3ω

2011 ◽  
Vol 357 (15) ◽  
pp. 2960-2965 ◽  
Author(s):  
M.L. Bauer ◽  
C.M. Bauer ◽  
M.C. Fish ◽  
R.E. Matthews ◽  
G.T. Garner ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Conductivity Measurements

Anisotropic Thermal Conductivity of A Si/Ge Superlattice

1998 ◽  
Vol 545 ◽  
Author(s):  
T. Borca-Tasciuc ◽  
D. Song ◽  
J. L. Liu ◽  
G. Chen ◽  
K. L. Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Thermal Conductivity ◽  
Temperature Drop ◽  
Differential Method ◽  
Conductivity Measurements ◽  
3Ω Method ◽  
Anisotropic Thermal Conductivity ◽  
Plane Direction ◽  
Narrow Width ◽  
Heat Spreading

AbstractExperimental evidence for a significant thermal conductivity reduction have been reported in recent years for GaAs/AlAs, Si/Ge, and Bi 2Te3/Sb2Te3 superlattices. In this work, we present preliminary experimental results on the reduction of the in-plane and cross-plane thermal conductivity for a symmetric Si/Ge superlattice. A differential 2-wire 3ω method is developed to perform the anisotropic thermal conductivity measurements. In this technique, a patterned heater with a width much larger than the film thickness yields the cross-plane thermal conductivity of the film. The in-plane thin film thermal conductivity is inferred from the temperature rise of a narrow width heater that can create more heat spreading in the in-plane direction of the thin film. A differential method to measure the temperature drop across the film is employed in order to increase the accuracy of the measurement.

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