Temperature lag with the onset of exchange bias, superparamagnetic blocking, and antiferromagnetic ordering in ultrathin ferromagnet/antiferromagnet thin film

2021 ◽  
Vol 130 (19) ◽  
pp. 193902
Author(s):  
Yu Shiratsuchi ◽  
Yiran Tao ◽  
Rou Tsutsumi ◽  
Kentaro Toyoki ◽  
Ryoichi Nakatani
Keyword(s):  
Thin Film ◽  
Exchange Bias ◽  
Antiferromagnetic Ordering

Magnetic textures in hemispherical thin film caps with in-plane exchange bias

2021 ◽  
Vol 129 (1) ◽  
pp. 015305
Author(s):  
Andreea Tomita ◽  
Meike Reginka ◽  
Rico Huhnstock ◽  
Maximilian Merkel ◽  
Dennis Holzinger ◽  
...  
Keyword(s):  
Thin Film ◽  
Exchange Bias

Effect of ultra-thin Cu underlayer on the magnetic properties of Ni80Fe50 / Fe50Mn50 films

1999 ◽  
Vol 562 ◽  
Author(s):  
C. Liu ◽  
L. Shen ◽  
H. Jiang ◽  
D. Yang ◽  
G. Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Exchange Bias ◽  
Film Material ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Maximum Value ◽  
Film Roughness

ABSTRACTThe Ni80Fe20/Fe50Mn50,thin film system exhibits exchange bias behavior. Here a systematic study of the effect of atomic-scale thin film roughness on coercivity and exchange bias is presented. Cu (t) / Ta (100 Å) / Ni80Fe20 (100 Å) / Fe50Mno50 (200 Å) / Ta (200 Å) with variable thickness, t, of the Cu underlayer were DC sputtered on Si (100) substrates. The Cu underlayer defines the initial roughness that is transferred to the film material since the film grows conformal to the initial morphology. Atomic Force Microscopy and X-ray diffraction were used to study the morphology and texture of the films. Morphological characterization is then correlated with magnetometer measurements. Atomic Force Microscopy shows that the root mean square value of the film roughness exhibits a maximum of 2.5 Å at t = 2.4 Å. X-ray diffraction spectra show the films are polycrystalline with fcc (111) texture and the Fe50Mn50 (111) peak intensity decreases monotonically with increasing Cu thickness, t. Without a Cu underlayer, the values of the coercivity and loop shift are, Hc = 12 Oe and Hp = 56 Oe, respectively. Both the coercivity and loop shift change with Cu underlayer thickness. The coercivity reaches a maximum value of Hc= 36 Oe at t = 4 Å. The loop shift exhibits an initial increase with t, reaches a maximum value of HP = 107 Oe at t = 2.4 Å, followed by a decrease with greater Cu thickness. These results show that a tiny increase in the film roughness has a huge effect on the exchange bias magnitude.

Giant exchange bias effect in all-3d-metal Ni38.8Co2.9Mn37.9Ti20.4 thin film

2020 ◽  
Vol 116 (2) ◽  
pp. 022412
Author(s):  
K. Liu ◽  
S. C. Ma ◽  
Z. S. Zhang ◽  
X. W. Zhao ◽  
B. Yang ◽  
...  
Keyword(s):  
Thin Film ◽  
Exchange Bias ◽  
Bias Effect ◽  
Exchange Bias Effect

Magnetic properties of epitaxial TmFe2O4 thin films with an anomalous interfacial structure

2020 ◽  
Vol 8 (34) ◽  
pp. 11704-11714
Author(s):  
You Jin Kim ◽  
Shinya Konishi ◽  
Yuichiro Hayasaka ◽  
Ryo Ota ◽  
Ryosuke Tomozawa ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Properties ◽  
Exchange Bias ◽  
Interface Structure ◽  
Yttria Stabilized Zirconia ◽  
Interfacial Structure ◽  
Stabilized Zirconia ◽  
Bias Effect ◽  
Exchange Bias Effect ◽  
Glassy Behavior

Epitaxial TmFe2O4 thin film with self-assembled interface structure was grown on yttria-stabilized zirconia substrate. TmFe2O4 phase itself shows glassy behavior and the interface leads to the exchange bias effect.

Magnetoresistance monitoring of processes that affect thin film exchange bias

2004 ◽  
Vol 95 (11) ◽  
pp. 7519-7521
Author(s):  
E. Negusse ◽  
Y. U. Idzerda ◽  
P. A. Suci
Keyword(s):  
Thin Film ◽  
Exchange Bias

Large perpendicular exchange bias and high blocking temperature in Al-doped Cr2O3/Co thin film systems

2017 ◽  
Vol 10 (7) ◽  
pp. 073003 ◽  
Author(s):  
Tomohiro Nozaki ◽  
Yohei Shiokawa ◽  
Yukie Kitaoka ◽  
Yohei Kota ◽  
Hiroshi Imamura ◽  
...  
Keyword(s):  
Thin Film ◽  
Exchange Bias ◽  
Blocking Temperature

Exchange bias in a thin film dispersion of MnO nanocrystallites in Co

2003 ◽  
Vol 264 (2-3) ◽  
pp. 146-152 ◽  
Author(s):  
J. van Lierop ◽  
M.A. Schofield ◽  
L.H. Lewis ◽  
R.J. Gambino
Keyword(s):  
Thin Film ◽  
Exchange Bias

Angular and NiFe thickness dependence of exchange bias in IrMn/NiFe/IrMn thin film

2006 ◽  
Vol 303 (2) ◽  
pp. e188-e191 ◽  
Author(s):  
Yong-Goo Yoo ◽  
Seong-Gi Min ◽  
Ho-Jun Ryu ◽  
Nam-Seok Park ◽  
Seong-Cho Yu
Keyword(s):  
Thin Film ◽  
Exchange Bias ◽  
Thickness Dependence
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