scholarly journals Impact of the channel length on molybdenum disulfide field effect transistors with hafnia-based high-k dielectric gate

AIP Advances ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 065229
Author(s):  
Yanxiao Sun ◽  
Gang Niu ◽  
Wei Ren ◽  
Jinyan Zhao ◽  
Yankun Wang ◽  
...  
2015 ◽  
Vol 107 (11) ◽  
pp. 113103 ◽  
Author(s):  
M. Venkata Kamalakar ◽  
B. N. Madhushankar ◽  
André Dankert ◽  
Saroj P. Dash

2011 ◽  
Vol 20 (01) ◽  
pp. 105-113
Author(s):  
S. RUMYANTSEV ◽  
W. STILLMAN ◽  
M. SHUR ◽  
T. HEEG ◽  
D.G. SCHLOM ◽  
...  

Insulated gate n-channel enhancement mode InGaAs field effect transistors with the GdScO 3 high-k dielectric have been fabricated and studied. The low frequency noise was high indicating a high interface density of traps. Trap density and its dependence on the gate voltage have been extracted from the noise and conductance measurements.


2012 ◽  
Vol 24 (40) ◽  
pp. 5433-5439 ◽  
Author(s):  
Kang-Jun Baeg ◽  
Dongyoon Khim ◽  
Soon-Won Jung ◽  
Minji Kang ◽  
In-Kyu You ◽  
...  

2017 ◽  
Vol 178 ◽  
pp. 190-193 ◽  
Author(s):  
Pavel Bolshakov ◽  
Peng Zhao ◽  
Angelica Azcatl ◽  
Paul K. Hurley ◽  
Robert M. Wallace ◽  
...  

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