An inertial piezoelectric actuator with small structure but large loading capacity

2021 ◽  
Vol 92 (8) ◽  
pp. 085004
Author(s):  
Yinghua Cao ◽  
Zhi Xu ◽  
Linjing You ◽  
Yaxuan Wu ◽  
Hu Huang
Keyword(s):  
Piezoelectric Actuator ◽  
Loading Capacity ◽  
Small Structure

Precise Impact Drive Mechanism Based on Asymmetrically Clamped Piezoelectric Actuator

2010 ◽  
Vol 37-38 ◽  
pp. 870-874 ◽  
Author(s):  
Shun Ming Hua ◽  
Guang Ming Cheng ◽  
Zhi Yu Zhang ◽  
Ping Zeng
Keyword(s):  
Piezoelectric Actuator ◽  
Dynamic Characteristics ◽  
Impact Force ◽  
Maximum Velocity ◽  
Loading Capacity ◽  
Electric Voltage ◽  
Drive Mechanism ◽  
Maximum Loading

A new precise linear impact drive mechanism (IDM) was proposed. Differing from the traditional ones, the new IDM can run silently driven by sinusoidal electric voltage. But the actuating force was also inertial impact force generated by a set of asymmetrically clamped cantilever bimorphs. The dynamic characteristics had been experimentally studied on prototype of the IDM. The main results under 50 volt are listed below. The resolution is 27 nm, the maximum velocity 17 mm/s at 35 Hz. And, the maximum loading capacity is not less than 100 g when applied 100 V at 35 Hz.

Failure Analysis With the Scanning Electron Microscope

1972 ◽  
Vol 30 ◽  
pp. 482-483
Author(s):  
John R. Devaney
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
High Reliability ◽  
Military Applications ◽  
Small Structure ◽  
Useful Life ◽  
Insight Into ◽  
Scanning Electron

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.

Sign in / Sign up

Export Citation Format

Share Document