Defect characterization and charge transport measurements in high-resolution Ni/n-4H-SiC Schottky barrier radiation detectors fabricated on 250 μm epitaxial layers
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2006 ◽
Vol 128
(34)
◽
pp. 11260-11267
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1990 ◽
Vol 101
(1-4)
◽
pp. 572-578
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2021 ◽