Threshold behavior and isotope effect in low-energy electronic stopping of light ions

2021 ◽  
Vol 129 (18) ◽  
pp. 185304
Author(s):  
Andreas Schinner ◽  
Vladimir I. Shulga ◽  
Peter Sigmund
Keyword(s):  
Isotope Effect ◽  
Low Energy ◽  
Threshold Behavior ◽  
Light Ions

Kinetics of growth of surface amorphous layers under irradiation of silicon with low-energy light ions

2003 ◽  
Vol 37 (3) ◽  
pp. 340-346 ◽  
Author(s):  
A. I. Titov ◽  
A. Yu. Azarov ◽  
V. S. Belyakov
Keyword(s):  
Low Energy ◽  
Light Ions ◽  
Kinetics Of

The sputtering mechanism for low-energy light ions

1979 ◽  
Vol 18 (4) ◽  
pp. 391-398 ◽  
Author(s):  
R. Behrisch ◽  
G. Maderlechner ◽  
B. M. U. Scherzer ◽  
M. T. Robinson
Keyword(s):  
Low Energy ◽  
Light Ions

Vortex Pinning on Low Energy Light Ions Irradiation

2000 ◽  
pp. 362-364
Author(s):  
T. Satou ◽  
M. Sasase ◽  
S. Okayasu ◽  
K. Hojou
Keyword(s):  
Vortex Pinning ◽  
Low Energy ◽  
Light Ions

Dosimetry of low-energy protons and light ions

2001 ◽  
Vol 46 (2) ◽  
pp. 473-485 ◽  
Author(s):  
J Besserer ◽  
P Bilski ◽  
J de Boer ◽  
T Kwiecien ◽  
M Moosburger ◽  
...  
Keyword(s):  
Low Energy ◽  
Light Ions

Ranges of low-energy, light ions in amorphous silicon

1983 ◽  
Vol 27 (6) ◽  
pp. 3528-3537 ◽  
Author(s):  
W. Wach ◽  
K. Wittmaack
Keyword(s):  
Amorphous Silicon ◽  
Low Energy ◽  
Light Ions

Angular resolved energy distributions of low energy light ions reflected from a polycrystalline Mo surface

2005 ◽  
Vol 337-339 ◽  
pp. 942-945 ◽  
Author(s):  
H. Yamaoka ◽  
Y. Matsumoto ◽  
M. Nishiura ◽  
K. Nishimura ◽  
M. Sasao ◽  
...  
Keyword(s):  
Low Energy ◽  
Energy Distributions ◽  
Light Ions

Die Sekundärelektronen-Ausbeute verschiedener Materialien bei Beschuß mit leichten Ionen hoher Energie / Secondary Electron Yield from Various Materials under the Impact of Light Ions at High Energies

1975 ◽  
Vol 30 (8) ◽  
pp. 981-985
Author(s):  
H. P. Beck ◽  
R. Langkau
Keyword(s):  
Secondary Electron ◽  
Low Energy ◽  
Secondary Electrons ◽  
Secondary Electron Yield ◽  
High Energies ◽  
Electron Yield ◽  
Light Ions ◽  
The Impact ◽  
Theoretical Considerations

Abstract The backward emission of secondary electrons from thick targets of graphite, aluminum, copper, molybdenum and tantalum under the impact of protons, deuterons, 3 He-ions and a-particles has been measured for incident energies in the MeV-range. The data are discussed within the scope of theoretical considerations based on low-energy studies taking into account the contribution due to ;< 5-rays.

Reflection and retention of low energy light ions during bombardment of fusion materials

1995 ◽  
Vol 220-222 ◽  
pp. 952-956 ◽  
Author(s):  
N.N. Koborov ◽  
V.A. Kurnaev ◽  
D.V. Levchuk ◽  
A.A. Pisarev ◽  
V.M. Sotnikov ◽  
...  
Keyword(s):  
Low Energy ◽  
Fusion Materials ◽  
Light Ions
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