Time-resolved ion energy measurements using a retarding potential analyzer

2021 ◽  
Vol 92 (7) ◽  
pp. 073306
Author(s):  
Matthew Baird ◽  
Ron McGee-Sinclair ◽  
Kristina Lemmer ◽  
Wensheng Huang
1993 ◽  
Vol 32 (Part 1, No. 10) ◽  
pp. 4756-4760
Author(s):  
Yoshifumi Saitou ◽  
Yoshiharu Nakamura ◽  
Masayoshi Tanaka ◽  
Akio Komori ◽  
Yoshinobu Kawai

2000 ◽  
Vol 647 ◽  
Author(s):  
O. Malis ◽  
J. M. Pomeroy ◽  
R. L. Headrick ◽  
J. D. Brock

AbstractThe sputter-erosion of hcp Co (0001) single crystal with Ar+ ions in the 100 to 700 eV energy range was investigated using in-situ time-resolved x-ray scattering. At temperatures above 300°C the surface remains relatively smooth, erosion evolving through a layer-by-layer or step flow mechanism. In this regime the ions have a smoothening effect on the surface and the resulting roughness decreases with increasing ion energy. Below 300°C the surface develops a pattern of mounds or pits with a characteristic wavelength. The time, ion energy and temperature dependence of this wavelength were studied in detail. Epitaxial Co thin films thermally evaporated on sapphire were also sputtered through in order to synthesize self-assembled arrays of Co nanoclusters with a narrow size distribution. The degree of local order within the Co dot arrays was examined using atomic force microscopy.


2017 ◽  
Vol 24 (11) ◽  
pp. 113501 ◽  
Author(s):  
A. Megía-Macías ◽  
O. D. Cortázar ◽  
O. Tarvainen ◽  
H. Koivisto

Sign in / Sign up

Export Citation Format

Share Document