Determination of the interface between amorphous insulator and crystalline 4H–SiC in transmission electron microscope image by using convolutional neural network

Hironori Yoshioka; Tomonori Honda

doi:10.1063/5.0036982

Determination of the interface between amorphous insulator and crystalline 4H–SiC in transmission electron microscope image by using convolutional neural network

AIP Advances ◽

10.1063/5.0036982 ◽

2021 ◽

Vol 11 (1) ◽

pp. 015101

Author(s):

Hironori Yoshioka ◽

Tomonori Honda

Keyword(s):

Neural Network ◽

Electron Microscope ◽

Convolutional Neural Network ◽

Transmission Electron Microscope ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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The computation of transmission electron microscope image profiles for dislocation loops in GaAs

Journal of Applied Physics ◽

10.1063/1.337338 ◽

1986 ◽

Vol 60 (3) ◽

pp. 965-967 ◽

Cited By ~ 14

Author(s):

S. P. Ardren ◽

C. A. B. Ball ◽

J. H. Neethling ◽

H. C. Snyman

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Dislocation Loops ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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High-Resolution Transmission Electron Microscope Image of the SiO2/(001)Si Interface

The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2 ◽

10.1007/978-1-4899-1588-7_26 ◽

1993 ◽

pp. 247-256

Author(s):

Hiroyuki Akatsu ◽

Yasuyuki Sumi ◽

Iwao Ohdomari

Keyword(s):

Electron Microscope ◽

High Resolution ◽

Transmission Electron Microscope ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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Application of Image Analysis and Fuzzy Reasoning on Transmission Electron Microscope Image of Carbon Materials

IEEJ Transactions on Electronics Information and Systems ◽

10.1541/ieejeiss1987.119.10_1119 ◽

1999 ◽

Vol 119 (10) ◽

pp. 1119-1125

Author(s):

Takashi Miyazaki ◽

Kyoichi Oshida ◽

Hiroaki Yamamoto ◽

Yasunari Shidama ◽

Morinobu Endo

Keyword(s):

Image Analysis ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Carbon Materials ◽

Fuzzy Reasoning ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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Computed and real transmission electron microscope image contrasts from grain boundaries

Acta Crystallographica Section A Foundations of Crystallography ◽

10.1107/s0108767384094174 ◽

1984 ◽

Vol 40 (a1) ◽

pp. C191-C191

Author(s):

M. J. Turunen ◽

H. O. Martikainen

Keyword(s):

Electron Microscope ◽

Grain Boundaries ◽

Transmission Electron Microscope ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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Collaborative Research and Development. Delivery Order 0006: Transmission Electron Microscope Image Modeling and Semiconductor Heterointerface Characterization

10.21236/ada463820 ◽

2006 ◽

Author(s):

Krishnamurthy Mahalingam

Keyword(s):

Electron Microscope ◽

Research And Development ◽

Transmission Electron Microscope ◽

Collaborative Research ◽

Image Modeling ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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CalAtom: A software for quantitatively analysing atomic columns in a transmission electron microscope image

Ultramicroscopy ◽

10.1016/j.ultramic.2019.04.007 ◽

2019 ◽

Vol 202 ◽

pp. 114-120 ◽

Cited By ~ 3

Author(s):

Q. Zhang ◽

L.Y. Zhang ◽

C.H. Jin ◽

Y.M. Wang ◽

F. Lin

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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Multiple-ellipse fitting method to precisely measure the positions of atomic columns in a transmission electron microscope image

Micron ◽

10.1016/j.micron.2018.06.016 ◽

2018 ◽

Vol 113 ◽

pp. 99-104 ◽

Cited By ~ 8

Author(s):

Q. Zhang ◽

C.H. Jin ◽

H.T. Xu ◽

L.Y. Zhang ◽

X.B. Ren ◽

...

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Ellipse Fitting ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Fitting Method ◽

Electron Microscope Image

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The transmission electron microscope image contrast of epitaxial interfaces with small misfits

Thin Solid Films ◽

10.1016/0040-6090(79)90473-5 ◽

1979 ◽

Vol 61 (3) ◽

pp. 289-295 ◽

Cited By ~ 16

Author(s):

F.D. Auret ◽

C.A.B. Ball ◽

H.C. Snyman

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Image Contrast ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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The First Transmission Electron Microscope Image Imagined by Artificial Intelligence

Applied Microscopy ◽

10.9729/am.2017.47.4.251 ◽

2017 ◽

Vol 47 (4) ◽

pp. 251-252

Author(s):

Jongyeong Lee ◽

Zonghoon Lee

Keyword(s):

Artificial Intelligence ◽

Electron Microscope ◽

Transmission Electron Microscope ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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Projected thickness reconstruction from a single defocused transmission electron microscope image of an amorphous object

Ultramicroscopy ◽

10.1016/j.ultramic.2011.03.007 ◽

2011 ◽

Vol 111 (8) ◽

pp. 959-968 ◽

Cited By ~ 7

Author(s):

A.C.Y. Liu ◽

D.M. Paganin ◽

L. Bourgeois ◽

P.N.H. Nakashima

Keyword(s):

Electron Microscope ◽

Transmission Electron Microscope ◽

Transmission Electron Microscope Image ◽

Microscope Image ◽

Transmission Electron ◽

Electron Microscope Image

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