Broadening change of diffraction line profile under elastic eccentric tension of a composite (three-layer) compact sample

2020 ◽  
Author(s):  
V. P. Gulyaev ◽  
P. P. Petrov ◽  
K. V. Stepanova
2018 ◽  
Vol 74 (6) ◽  
pp. 640-646
Author(s):  
K. R. Beyerlein ◽  
P. Scardi

An accurate description of the diffraction line profile from nanocrystalline powders can be obtained by a spherical harmonics expansion of the profile function. The procedure outlined in this work is found to be computationally efficient and applicable to the line profile for any crystallite shape and size. Practical examples of the diffraction pattern peak profiles resulting from cubic crystallites between 1 and 100 nm in size are shown.


1994 ◽  
Vol 73 (1) ◽  
pp. 102-105 ◽  
Author(s):  
I. R. Peterson ◽  
V. M. Kaganer

2004 ◽  
Vol 27 (1) ◽  
pp. 59-67 ◽  
Author(s):  
K. Kapoor ◽  
D. Lahiri ◽  
S. V. R. Rao ◽  
T. Sanyal ◽  
B. P. Kashyap

2001 ◽  
Vol 378-381 ◽  
pp. 753-758
Author(s):  
Alexandre Boulle ◽  
C. Legrand ◽  
P. Thomas ◽  
R. Guinebretière ◽  
J.P. Mercurio ◽  
...  

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