Light reflectance and photoelectron yield spectroscopy enable acceptor level measurement in p-type Ba1−xTiO3 semiconductor
2012 ◽
Vol 717-720
◽
pp. 1195-1198
Keyword(s):
1984 ◽
Vol 50
(12)
◽
pp. 1051-1055
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2019 ◽
Vol 48
(6)
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pp. 3554-3561
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Keyword(s):
2012 ◽
Vol 468-471
◽
pp. 1501-1507
◽
Keyword(s):
2013 ◽
Vol 57
◽
pp. 51-57
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Observation of acceptor level of p-type SrTiO3 by high-resolution soft-X-ray absorption spectroscopy
2003 ◽
Vol 199
◽
pp. 255-259
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