Efficiency degradation induced by surface defects-assisted tunneling recombination in GaN/InGaN micro-light-emitting diodes
Keyword(s):
2009 ◽
Vol 6
(S2)
◽
pp. S538-S540
◽
Keyword(s):
2015 ◽
Vol 14
(2)
◽
pp. 444-455
◽
2020 ◽
Vol 20
(6)
◽
pp. 3754-3761
◽
Keyword(s):
2015 ◽
Vol 212
(5)
◽
pp. 947-953
◽
Keyword(s):