scholarly journals Investigation of the dynamic properties of on-chip coupled piezo/photodiodes by time-resolved atomic force and Kelvin probe microscopy

AIP Advances ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 105121
Author(s):  
Willemijn M. Luiten ◽  
Verena M. van der Werf ◽  
Noureen Raza ◽  
Rebecca Saive
Keyword(s):  
Dynamic Properties ◽  
Kelvin Probe ◽  
Time Resolved ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Atomic Force ◽  
On Chip

Determination of the Physical Properties of Oil Sands Components using Scanning Probe Microscopy

2015 ◽  
Vol 1754 ◽  
pp. 69-74
Author(s):  
Ravi Gaikwad ◽  
Tinu Abraham ◽  
Aharnish Hande ◽  
Fatemeh Bakhtiari ◽  
Siddhartha Das ◽  
...  
Keyword(s):  
Oil Sands ◽  
Structural Changes ◽  
Rational Approach ◽  
Kelvin Probe ◽  
Scanning Calorimetry ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTAtomic force microscopy is employed to study the structural changes in the morphology and physical characteristics of asphaltene aggregates as a function of temperature. The exotic fractal structure obtained by evaporation-driven asphaltene aggregates shows an interesting dynamics for a large range of temperatures from 25°C to 80°C. The changes in the topography, surface potential and adhesion are unnoticeable until 70°C. However, a significant change in the dynamics and material properties is displayed in the range of 70°C - 80°C, during which the aspahltene aggregates acquire ‘liquid-like’ mobility and fuse together. This behaviour is attributed to the transition from the pure amorphous phase to a crystalline liquid phase which occurs at approximately 70°C as shown by using Differential Scanning Calorimetry (DSC). Additionally, the charged nature of asphaltenes and bitumen is also explored using kelvin probe microscopy. Such observations can lead to the development of a rational approach to the fundamental understanding of asphaltene aggregation dynamics and may help in devising novel techniques for the handling and separation of asphaltene aggregates using dielectrophoretic methods.

Characterization of GaN and Al0.35Ga0.65N/GaN Heterostructures by Scanning Kelvin Probe Microscopy

2001 ◽  
Vol 680 ◽  
Author(s):  
G. Koley ◽  
M. G. Spencer
Keyword(s):  
Chemical Vapor ◽  
Kelvin Probe ◽  
Contact Mode ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Kelvin Probe ◽  
Gan Heterostructure ◽  
Growth Features

ABSTRACTScanning Kelvin probe microscopy (SKPM) technique operated in feedback mode has been used to characterize GaN (unintentionally n-type doped, n+ doped and semi-insulating), and Al0.35Ga0.65N/GaN heterostructures (with varying Al0.35Ga0.65N thickness) grown by metalorganic chemical vapor deposition and molecular beam epitaxy. SKPM was used to measure the surface potential on these materials. The measurement technique was calibrated using metal calibration samples of Pt, Au, Ni and Al. The BSBH for n-doped GaN was measured to be 0.7 eV, which is in good agreement with values reported in the literature. Growth features such as dislocations present on the surfaces of III-nitrides were also investigated for their electrical properties using SKPM and non-contact mode atomic force microscopy, simultaneously. The dislocations have been found to be negatively charged for GaN as well as Al0.35Ga0.65N/GaN heterostructure samples.

High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy

1999 ◽  
Vol 75 (2) ◽  
pp. 286-288 ◽  
Author(s):  
Ch. Sommerhalter ◽  
Th. W. Matthes ◽  
Th. Glatzel ◽  
A. Jäger-Waldau ◽  
M. Ch. Lux-Steiner
Keyword(s):  
Atomic Force Microscopy ◽  
High Vacuum ◽  
High Sensitivity ◽  
Ultra High Vacuum ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Kelvin Probe Microscopy of Localized Electric Potentials Induced in Insulating Materials by Electron Irradiation

2004 ◽  
Vol 10 (6) ◽  
pp. 797-803 ◽  
Author(s):  
Marion A. Stevens-Kalceff
Keyword(s):  
Electrical Potential ◽  
Beam Irradiation ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Microscopy Technique ◽  
Atomic Force ◽  
Charged Beam ◽  
Induced Defects ◽  
Trapped Charge

Kelvin probe microscopy (KPM) is a specialized atomic force microscopy technique in which long-range Coulomb forces between a conductive atomic force probe and a specimen enable the electrical potential at the surface of a specimen to be characterized with high spatial resolution. KPM has been used to characterize nonconductive materials following their exposure to stationary electron beam irradiation in a scanning electron microscope (SEM). Charged beam irradiation of poorly conducting materials results in the trapping of charge at either preexisting or irradiation-induced defects. The reproducible characteristic surface potentials associated with the trapped charge have been mapped using KPM. Potential profiles are calculated and compared with observed potential profiles giving insight into the charging processes and residual trapped charge distributions.

Polarization Effects in Graded AlGaN Nanolayers Revealed by Current-Sensing and Kelvin Probe Microscopy

2018 ◽  
Vol 10 (7) ◽  
pp. 6755-6763 ◽  
Author(s):  
Petro M. Lytvyn ◽  
Andrian V. Kuchuk ◽  
Yuriy I. Mazur ◽  
Chen Li ◽  
Morgan E. Ware ◽  
...  
Keyword(s):  
Kelvin Probe ◽  
Current Sensing ◽  
Polarization Effects ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy

Localized charge imaging with scanning Kelvin probe microscopy

2016 ◽  
Vol 28 (2) ◽  
pp. 025703 ◽  
Author(s):  
M F Orihuela ◽  
A M Somoza ◽  
J Colchero ◽  
M Ortuño ◽  
E Palacios-Lidón
Keyword(s):  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe

Quantitative amplitude-modulation scanning Kelvin probe microscopy via the second eigenmode excitation

2021 ◽  
pp. 113399
Author(s):  
Junqi Lai ◽  
Cheng Wang ◽  
Zhiwei Xing ◽  
Shulong Lu ◽  
Qi Chen ◽  
...  
Keyword(s):  
Amplitude Modulation ◽  
Kelvin Probe ◽  
Probe Microscopy ◽  
Kelvin Probe Microscopy ◽  
Scanning Kelvin Probe
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