Design and optimization of a proportional counter for the absolute determination of low-energy x-ray emission rates

2020 ◽  
Vol 91 (10) ◽  
pp. 103304
Author(s):  
V. H. Elvira ◽  
M. Roteta ◽  
A. Fernández-Sotillo ◽  
E. García-Toraño
Keyword(s):  
Proportional Counter ◽  
Low Energy ◽  
Emission Rates ◽  
X Ray ◽  
Design And Optimization ◽  
Absolute Determination ◽  
The Absolute

Absolute determination of low-energy X-ray emission rates with a proportional counter

2020 ◽  
Vol 160 ◽  
pp. 109113 ◽  
Author(s):  
V.H. Elvira ◽  
V. Peyrés ◽  
M. Roteta ◽  
A. Fernández-Sotillo ◽  
E. García-Toraño
Keyword(s):  
Proportional Counter ◽  
Low Energy ◽  
Emission Rates ◽  
X Ray ◽  
Absolute Determination

The absolute determination of the reflection integral of Bragg X-ray analyser crystals. Two-reflection methods

1977 ◽  
Vol 6 (3) ◽  
pp. 132-139 ◽  
Author(s):  
Kenton D. Evans ◽  
Bryan Leigh ◽  
Margaret Lewis
Keyword(s):  
X Ray ◽  
Absolute Determination ◽  
The Absolute

Polarity Determination in Sphalerite and Wurtzite Structures

1990 ◽  
Vol 48 (2) ◽  
pp. 500-501
Author(s):  
Stuart McKernan ◽  
C. Barry Carter
Keyword(s):  
Opposite Polarity ◽  
Single Domain ◽  
Polar Material ◽  
Electron Microscopic ◽  
Dynamical Interaction ◽  
X Ray ◽  
Polarity Determination ◽  
The Absolute ◽  
Microscopic Techniques

The determination of the absolute polarity of a polar material is often crucial to the understanding of the defects which occur in such materials. Several methods exist by which this determination may be performed. In bulk, single-domain specimens, macroscopic techniques may be used, such as the different etching behavior, using the appropriate etchant, of surfaces with opposite polarity. X-ray measurements under conditions where Friedel’s law (which means that the intensity of reflections from planes of opposite polarity are indistinguishable) breaks down can also be used to determine the absolute polarity of bulk, single-domain specimens. On the microscopic scale, and particularly where antiphase boundaries (APBs), which separate regions of opposite polarity exist, electron microscopic techniques must be employed. Two techniques are commonly practised; the first [1], involves the dynamical interaction of hoLz lines which interfere constructively or destructively with the zero order reflection, depending on the crystal polarity. The crystal polarity can therefore be directly deduced from the relative intensity of these interactions.

scholarly journals Preparative-scale HPLC Resolution of Metallacyclic η3-Allyltricarbonyliron Complexes and Determination of the Absolute Configuration by X-Ray Crystal Structure Analysis

1999 ◽  
Vol 23 (9) ◽  
pp. 578-579
Author(s):  
Rainer Schobert ◽  
Hermann Pfab ◽  
Jutta Böhmer ◽  
Frank Hampel ◽  
Andreas Werner
Keyword(s):  
Crystal Structure ◽  
Silica Gel ◽  
Structure Analysis ◽  
Absolute Configuration ◽  
Crystal Structure Analysis ◽  
Preparative Scale ◽  
X Ray ◽  
The Absolute

Racemates of (η3-allyl)tricarbonyliron lactone complex Fe(CO)3{η1:η3-C(O)XCH2CHCMeCH2} 1a (X = O) and (η3-allyl)tricarbonyliron lactam complex 2a (X = NMe) are resolved on a preparative scale by HPLC on cellulose tris(3,5-dimethylphenyl)carbamate/silica gel RP-8 and the absolute configuration of (-)-2a is determined by X-ray crystal structure analysis.

scholarly journals Determination of low energy (>160 keV) X-ray spectra and verification of transport calculations through silicon

1997 ◽  
Vol 44 (6) ◽  
pp. 2065-2070 ◽  
Author(s):  
J.R. Turinetti ◽  
K.L. Critchfield ◽  
J.R. Chavez ◽  
W.T. Kemp ◽  
R.D. Bellem ◽  
...  
Keyword(s):  
Low Energy ◽  
X Ray
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