scholarly journals Magneto-optical Kerr microscopy investigation of magnetization reversal in Co2FeSi Heusler alloy thin films

AIP Advances ◽  
2020 ◽  
Vol 10 (6) ◽  
pp. 065017
Author(s):  
Binoy Krishna Hazra ◽  
S. N. Kaul ◽  
S. Srinath ◽  
Zaineb Hussain ◽  
V. Raghavendra Reddy ◽  
...  
2018 ◽  
Vol 123 (5) ◽  
pp. 053901 ◽  
Author(s):  
Vineet Barwal ◽  
Sajid Husain ◽  
Nilamani Behera ◽  
Ekta Goyat ◽  
Sujeet Chaudhary

Author(s):  
Yechao Ling ◽  
Yong Hu ◽  
Haobo Wang ◽  
Ben Niu ◽  
Jiawei Chen ◽  
...  

2012 ◽  
Vol 51 (2) ◽  
pp. 02BM04 ◽  
Author(s):  
Naoto Fukatani ◽  
Keima Inagaki ◽  
Kenichiro Mari ◽  
Hirohito Fujita ◽  
Tetsuta Miyawaki ◽  
...  

1991 ◽  
Vol 15 (2) ◽  
pp. 93-96 ◽  
Author(s):  
O. Ishii ◽  
F. Yoshimura ◽  
S. Hirono

1998 ◽  
Vol 57 (23) ◽  
pp. 14990-14998 ◽  
Author(s):  
A. Khapikov ◽  
L. Uspenskaya ◽  
J. Ebothe ◽  
S. Vilain

2010 ◽  
Vol 108 (10) ◽  
pp. 103906 ◽  
Author(s):  
Hans Boschker ◽  
Jaap Kautz ◽  
Evert P. Houwman ◽  
Gertjan Koster ◽  
Dave H. A. Blank ◽  
...  

1997 ◽  
Vol 12 (8) ◽  
pp. 1942-1945 ◽  
Author(s):  
H. J. Gao ◽  
H. X. Zhang ◽  
Z. Q. Xue ◽  
S. J. Pang

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) investigation of tetracyanoquinodimethane (TCNQ) and the related C60-TCNQ thin films is presented. Periodic molecular chains of the TCNQ on highly oriented pyrolytic graphite (HOPG) substrates were imaged, which demonstrated that the crystalline (001) plane was parallel to the substrate. For the C60-TCNQ thin films, we found that there were grains on the film surface. STM images within the grain revealed that the well-ordered rows and terraces, and the parallel rows in different grains were generally not in the same orientation. Moreover, the grain boundary was also observed. In addition, AFM was employed to modify the organic TCNQ film surface for the application of this type of materials to information recording and storage at the nanometer scale. The nanometer holes were successfully created on the TCNQ thin film by the AFM.


2010 ◽  
Vol 208 (3) ◽  
pp. 675-678 ◽  
Author(s):  
M. A. I. Nahid ◽  
M. Oogane ◽  
H. Naganuma ◽  
Y. Ando

Sign in / Sign up

Export Citation Format

Share Document