The small-deflection energy analyzer (SDEA): Enabling multi-point investigations in the thermosphere–ionosphere

2020 ◽  
Vol 91 (9) ◽  
pp. 095105
Author(s):  
Federico Herrero ◽  
Andrew Nicholas ◽  
Ted Finne ◽  
Hollis Jones ◽  
Dean Aalami
Author(s):  
Yasushi Kokubo ◽  
Hirotami Koike ◽  
Teruo Someya

One of the advantages of scanning electron microscopy is the capability for processing the image contrast, i.e., the image processing technique. Crewe et al were the first to apply this technique to a field emission scanning microscope and show images of individual atoms. They obtained a contrast which depended exclusively on the atomic numbers of specimen elements (Zcontrast), by displaying the images treated with the intensity ratio of elastically scattered to inelastically scattered electrons. The elastic scattering electrons were extracted by a solid detector and inelastic scattering electrons by an energy analyzer. We noted, however, that there is a possibility of the same contrast being obtained only by using an annular-type solid detector consisting of multiple concentric detector elements.


Author(s):  
T. Oikawa ◽  
M. Inoue ◽  
T. Honda ◽  
Y. Kokubo

EELS allows us to make analysis of light elements such as hydrogen to heavy elements of microareas on the specimen. In energy loss spectra, however, elemental signals ride on a high background; therefore, the signal/background (S/B) ratio is very low in EELS. A technique which collects the center beam axial-symmetrically in the scattering angle is generally used to obtain high total intensity. However, the technique collects high background intensity together with elemental signals; therefore, the technique does not improve the S/B ratio. This report presents the experimental results of the S/B ratio measured as a function of the scattering angle and shows the possibility of the S/B ratio being improved in the high scattering angle range.Energy loss spectra have been measured using a JEM-200CX TEM with an energy analyzer ASEA3 at 200 kV.Fig.l shows a typical K-shell electron excitation edge riding on background in an energy loss spectrum.


Author(s):  
S. Likharev ◽  
A. Kramarenko ◽  
V. Vybornov

At present time the interest is growing considerably for theoretical and experimental analysis of back-scattered electrons (BSE) energy spectra. It was discovered that a special angle and energy nitration of BSE flow could be used for increasing a spatial resolution of BSE mode, sample topography investigations and for layer-by layer visualizing of a depth structure. In the last case it was shown theoretically that in order to obtain suitable depth resolution it is necessary to select a part of BSE flow with the directions of velocities close to inverse to the primary beam and energies within a small window in the high-energy part of the whole spectrum.A wide range of such devices has been developed earlier, but all of them have considerable demerit: they can hardly be used with a standard SEM due to the necessity of sufficient SEM modifications like installation of large accessories in or out SEM chamber, mounting of specialized detector systems, input wires for high voltage supply, screening a primary beam from additional electromagnetic field, etc. In this report we present a new scheme of a compact BSE energy analyzer that is free of imperfections mentioned above.


1999 ◽  
Author(s):  
Christopher G. H. Walker ◽  
Andrew Walker ◽  
Ranjan Badheka ◽  
Sumio Kumashiro ◽  
Marcus Jacka ◽  
...  

2002 ◽  
Vol 09 (01) ◽  
pp. 583-586
Author(s):  
KOTA IWASAKI ◽  
KOICHIRO MITSUKE

A new angle-resolving electron energy analyzer composed of a conical electrostatic prism and a position-sensitive detector was developed for gas phase photoelectron spectroscopy. The performance of the analyzer has been tested by measuring photoelectron spectra of Ar using a helium discharge lamp. The angular resolution of 3° was achieved at the pass energy E of 5.6 eV. The best energy resolution was ΔE/E = 0.043 at E = 1.4 eV .


1987 ◽  
Vol 58 (6) ◽  
pp. 958-967 ◽  
Author(s):  
Renhe Tian ◽  
Manfred Fink
Keyword(s):  

1985 ◽  
Vol 24 (Part 1, No. 3) ◽  
pp. 337-341 ◽  
Author(s):  
Yoshiyuki Sakai ◽  
Ituso Katsumata

2008 ◽  
Vol 1 (1) ◽  
pp. 413-423 ◽  
Author(s):  
G. Lebedev ◽  
C. Jozwiak ◽  
N. Andresen ◽  
A. Lanzara ◽  
Z. Hussain

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