Influence of the near‐band‐edge surface states on the luminescence efficiency of InP

1986 ◽  
Vol 48 (20) ◽  
pp. 1362-1364 ◽  
Author(s):  
J. M. Moison ◽  
M. Van Rompay ◽  
M. Bensoussan
1996 ◽  
Vol 449 ◽  
Author(s):  
L.-L. Chao ◽  
G. S. Cargill ◽  
C. Kothandaraman

ABSTRACTCathodoluminescence (CL) spectroscopy and microscopy were used to study the luminescent properties of a variety of GaN films, both Si-doped and unintentionally-doped, grown on sapphire substrates. A narrow and intense near band-edge emission was found in the CL spectrum of each film examined, and deep-level emission was also observed for some of the films. The luminescence efficiency of near band-edge emission increased with a faster rate than that of deep-level emission when the pumping current was increased. Spatial nonuniformities of luminescence were observed in monochromatic CL microscopy, and microstructures were observed in scanning electron microscopy. No correlations between luminescence features and microstructural features were seen. Degradation of near band-edge luminescence was observed, accompanied by growth of deep-level emission.


1995 ◽  
Vol 34 (Part 1, No. 1) ◽  
pp. 42-47 ◽  
Author(s):  
Gwo-Cherng Jiang ◽  
Yih Chang ◽  
Liann-Be Chang ◽  
Yung-Der Juang ◽  
SuLu

1996 ◽  
Vol 79 (11) ◽  
pp. 8682-8687 ◽  
Author(s):  
R. A. Hogg ◽  
K. Takahei ◽  
A. Taguchi

2002 ◽  
Vol 91 (12) ◽  
pp. 9827 ◽  
Author(s):  
M. Germain ◽  
E. Kartheuser ◽  
A. L. Gurskii ◽  
E. V. Lutsenko ◽  
I. P. Marko ◽  
...  

1979 ◽  
Vol 10 (21) ◽  
Author(s):  
B. J. FITZPATRICK ◽  
R. N. BHARGAVA ◽  
S. P. HERKO ◽  
P. M. HARNACK

1988 ◽  
Vol 27 (Part 1, No. 9) ◽  
pp. 1669-1673 ◽  
Author(s):  
Katsumi Mochizuki ◽  
Katashi Masumoto

2015 ◽  
Vol 649 ◽  
pp. 625-629 ◽  
Author(s):  
Rui Deng ◽  
Yong-Feng Li ◽  
Bin Yao ◽  
Zhan-Hui Ding ◽  
Xuan Fang ◽  
...  

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