Magneto‐optic determinations of the pressure dependence of band‐gap energies and effective masses in strained‐layer superlattices

1985 ◽  
Vol 47 (5) ◽  
pp. 492-494 ◽  
Author(s):  
E. D. Jones ◽  
H. Ackermann ◽  
J. E. Schirber ◽  
T. J. Drummond ◽  
L. R. Dawson ◽  
...  
1985 ◽  
Vol 56 ◽  
Author(s):  
E. D. JONES ◽  
J. E. SCHIRBER ◽  
I. J. FRITZ ◽  
P. L. GOURLEY ◽  
R. M. BIEFELD ◽  
...  

AbstractMagneto—optic studies on InGaAs/GaAs and GaAs/GaPAs strained—layer superlattices are used to determine the in—plane light—hole valence—band effective masses. Also, hydrostatic pressure—dependent magneto—optic studies have been performed on these samples for magnetic fields up to 65 kG andpressures to 4 kbar in the temperature range of 1.6 - 4 K. The experimental pressure coefficients of the band—gap energy and the effective mass in the InGaAs/GaAsSLS structures were determined.


1985 ◽  
Vol 55 (6) ◽  
pp. 525-527 ◽  
Author(s):  
E.D. Jones ◽  
H. Ackermann ◽  
J.E. Schirber ◽  
T.J. Drummond ◽  
L.R. Dawson ◽  
...  

1989 ◽  
Author(s):  
H. Okumura ◽  
K. Miki ◽  
S. Misawa ◽  
K. Sakamoto ◽  
T. Sakamoto ◽  
...  

Author(s):  
S. Chadda ◽  
A. K. Datye ◽  
L. R. Dawson

III-V alloy devices are being considered for applications as infrared detectors, by several research groups due to processing advantages over II-VI alloy devices. InAs0.4Sb0.6 has the lowest band gap at 77 K among all III-V compounds, which corresponds to a cut off wavelength of 9 μm. The use of strained layer superlattices (SLS) was first proposed by Osbourn for lowering the band gap and achieving absorption at wavelengths greater than 12 μm at 77 K. A schematic diagram of the device is shown in figure 1. It was grown by Molecular Beam Epitaxy (MBE) at 425 °C and it consists of a p-n junction embedded in a InAs0.15Sb0.85/InSb SLS with layers of equal (110 Å) thickness. The n and p type dopants were S (PbS) and Be respectively. The active device SLS was grown on a composition graded strain relief buffer on the (100) face of an InSb substrate. The samples were sliced, thinned, polished, dimpled and ion milled for making cross-section Transmission Electron Microscope (TEM) samples.


1987 ◽  
Vol 48 (C5) ◽  
pp. C5-321-C5-327 ◽  
Author(s):  
H. BRUGGER ◽  
G. ABSTREITER

Sign in / Sign up

Export Citation Format

Share Document