Time‐resolved measurements of stimulated surface polariton wave scattering and grating formation in pulsed‐laser‐annealed germanium

1982 ◽  
Vol 41 (7) ◽  
pp. 630-632 ◽  
Author(s):  
D. J. Ehrlich ◽  
S. R. J. Brueck ◽  
J. Y. Tsao
Keyword(s):  
Wave Scattering ◽  
Pulsed Laser ◽  
Surface Polariton ◽  
Time Resolved ◽  
Polariton Wave ◽  
Grating Formation ◽  
Time Resolved Measurements

Time-Resolved Measurements of Impulse Generation in Pulsed Laser-Ablative Propulsion

2008 ◽  
Vol 24 (2) ◽  
pp. 322-329 ◽  
Author(s):  
Kohei Anju ◽  
Keisuke Sawada ◽  
Akihiro Sasoh ◽  
Koichi Mori ◽  
Eugene Zaretsky
Keyword(s):  
Pulsed Laser ◽  
Time Resolved ◽  
Impulse Generation ◽  
Time Resolved Measurements

Time-resolved measurements of sodium emission in the plume generated by laser ablation of myocardium tissue

2004 ◽  
Author(s):  
Hanriete P. de Souza ◽  
Egberto Munin ◽  
Carlos Eduardo de Vilhena Paiva ◽  
Leandro P. Alves ◽  
Marcela L. Redigolo ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Time Resolved ◽  
Time Resolved Measurements

scholarly journals Overheating In Silicon During Pulsed-Laser Irradiation?

1985 ◽  
Vol 51 ◽  
Author(s):  
B. C. Larson ◽  
J. Z. Tischler ◽  
D. M. Mills
Keyword(s):  
Laser Irradiation ◽  
Thermal Strain ◽  
Pulsed Laser ◽  
Interface Velocity ◽  
High Energy ◽  
Time Resolved ◽  
Synchrotron Source ◽  
Zero Velocity ◽  
The Difference ◽  
Pulsed Laser Irradiation

ABSTRACTNanosecond resolution time-resolved x-ray diffraction measurements of thermal strain have been used to measure the interface temperatures in silicon during pulsed-laser irradiation. The pulsed-time-structure of the Cornell High Energy Synchrotron Source (CHESS) was used to measure the temperature of the liquid-solid interface of <111> silicon during melting with an interface velocity of 11 m/s, at a time of near zero velocity, and at a regrowth velocity of 6 m/s. The results of these measurements indicate 110 K difference between the temperature of the interface during melting and regrowth, and the measurement at zero velocity shows that most of the difference is associated with undercooling during the regrowth phase.

scholarly journals Time-Resolved Quadrupole Mass Spectrometric Studies on Pulsed Laser Ablation of TiO2

1999 ◽  
Vol 18 (3) ◽  
pp. 99-109 ◽  
Author(s):  
Yongxin Tang ◽  
Zhenhui Han ◽  
Qizong Qin
Keyword(s):  
Laser Ablation ◽  
Continuous Wave ◽  
Center Of Mass ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Ionic Species ◽  
Mass Spectrometric ◽  
Quadrupole Mass ◽  
Time Resolved ◽  
Ambient Oxygen

Pulsed laser ablation of TiO2 at 355 nm and 532 nm has been investigated using an angleand time-resolved quadrupole mass spectrometric technique. The major ablated species include O (m/e = 16), O2 (m/e = 32), Ti (m/e = 48), TiO (m/e = 64) and TiO2 (m/e = 80). The time-of-flight (TOF) spectra of ablated species are measured for the ionic and neutral ablated species, and they can be fitted by a Maxwell – Boltzmann (M – B) distribution with a center-of-mass velocity. The measured angular distributions of the ionic species (O+ and Ti+) and the neutral species (O and Ti) can be fitted with cos⁡nθ and a cos⁡θ + (1−a)cos⁡nθ, respectively. In addition, a continuous wave oxygen molecular beam is introduced into the ablated plume, and the enhancement of the signal intensities of TiO is observed. It implies that the ablated Ti atoms/ions species can react with ambient oxygen molecules in the gas phase. In the meanwhile, the physicochemical mechanism of pulsed laser ablation of TiO2 is discussed.

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