scholarly journals Time-Resolved Quadrupole Mass Spectrometric Studies on Pulsed Laser Ablation of TiO2

1999 ◽  
Vol 18 (3) ◽  
pp. 99-109 ◽  
Author(s):  
Yongxin Tang ◽  
Zhenhui Han ◽  
Qizong Qin
Keyword(s):  
Laser Ablation ◽  
Continuous Wave ◽  
Center Of Mass ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Ionic Species ◽  
Mass Spectrometric ◽  
Quadrupole Mass ◽  
Time Resolved ◽  
Ambient Oxygen

Pulsed laser ablation of TiO2 at 355 nm and 532 nm has been investigated using an angleand time-resolved quadrupole mass spectrometric technique. The major ablated species include O (m/e = 16), O2 (m/e = 32), Ti (m/e = 48), TiO (m/e = 64) and TiO2 (m/e = 80). The time-of-flight (TOF) spectra of ablated species are measured for the ionic and neutral ablated species, and they can be fitted by a Maxwell – Boltzmann (M – B) distribution with a center-of-mass velocity. The measured angular distributions of the ionic species (O+ and Ti+) and the neutral species (O and Ti) can be fitted with cos⁡nθ and a cos⁡θ + (1−a)cos⁡nθ, respectively. In addition, a continuous wave oxygen molecular beam is introduced into the ablated plume, and the enhancement of the signal intensities of TiO is observed. It implies that the ablated Ti atoms/ions species can react with ambient oxygen molecules in the gas phase. In the meanwhile, the physicochemical mechanism of pulsed laser ablation of TiO2 is discussed.

Spectrum analysis of plasma produced by pulsed laser ablation of GaAs

2007 ◽  
Vol 73 (2) ◽  
pp. 231-239 ◽  
Author(s):  
AI HUA LIU
Keyword(s):  
Laser Ablation ◽  
Ambient Pressure ◽  
Pulsed Laser ◽  
Emission Spectra ◽  
Diagnostic Technique ◽  
Pulsed Laser Ablation ◽  
Stark Broadening ◽  
Experimental Conditions ◽  
Time Resolved ◽  
Excited Atoms

Abstract.A time-resolved diagnostic technique was used to investigate the emission spectra from the plasmas produced by 1.06 μm, 10 ns pulsed laser ablation of semiconductor GaAs. The characteristics of the species in plasma produced at different ambient pressure were analyzed. The full width at half maximum of the spectral line was measured and analyzed according to obtained spectra of the excited atoms; several line broadening factors were estimated according to our experimental conditions and the results indicate that the Stark broadening is the main broadening mechanism. Under the assumption of local thermodynamic equilibrium, the time evolution of electron number density was deduced from the Stark broadening measurements.

scholarly journals A study of the reactions of Ni+ and NiO+ ions relevant to planetary upper atmospheres

2020 ◽  
Vol 22 (16) ◽  
pp. 8940-8951 ◽  
Author(s):  
David L. Bones ◽  
Shane M. Daly ◽  
Thomas P. Mangan ◽  
John M. C. Plane
Keyword(s):  
Laser Ablation ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Mass Spectrometric ◽  
Mass Spectrometric Detection ◽  
Metal Target ◽  
Flow Tube ◽  
Nickel Metal ◽  
Fast Flow

The reactions between Ni+ and O3, O2, N2, CO2 and H2O; NiO+ and O, O3 and CO; and NiO2+ and O3 were studied at 294 K using the pulsed laser ablation of a nickel metal target in a fast flow tube, with mass spectrometric detection of Ni+ and NiO+.

Time Resolved Diagnostic of Dual-Pulsed Laser Ablation on Graphite Targets

2006 ◽  
Author(s):  
R. Sanginés de Castro ◽  
C. Sánchez Aké ◽  
H. Sobral ◽  
M. Villagrán-Muniz
Keyword(s):  
Laser Ablation ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Time Resolved

Consideration of growth process of diamond thin films in ambient oxygen by pulsed laser ablation of graphite

2002 ◽  
Vol 197-198 ◽  
pp. 352-356 ◽  
Author(s):  
Tsuyoshi Yoshitake ◽  
Takashi Nishiyama ◽  
Takeshi Hara ◽  
Kunihito Nagayama
Keyword(s):  
Thin Films ◽  
Laser Ablation ◽  
Growth Process ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Ambient Oxygen ◽  
Diamond Thin Films

Thin-Film Deposition Via Pulsed Laser Ablation

1996 ◽  
Vol 441 ◽  
Author(s):  
V. G. Panayotov ◽  
M. C. Kelly ◽  
G. G. Gomlak ◽  
T. L. T. Birdwhistell ◽  
B. D. Koplitz
Keyword(s):  
Thin Film ◽  
Laser Ablation ◽  
Experimental Approach ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Thin Film Deposition ◽  
Ionic Species ◽  
Film Deposition ◽  
Original Sample ◽  
532 Nm

AbstractWe report on a novel experimental approach for thin-film deposition via pulsed laser ablation. A combination of design features including the incorporation of original sample manipulation methods as well as enhanced analytical capabilities allow for experimental control and flexibility for thin-film deposition studies of a variety of materials. Here, the application is illustrated with a study of 532 nm pulsed laser ablation and subsequent deposition of CdTe.Conditions have been found that produce a mildly energetic ablation plume, and the average kinetic energies for the neutral and ionic ablation species in the plume have been determined to be approximately 2 and 11 eV, respectively. It has been shown that in the presence of an electric field the ionic species can be diverted away from the detector (and subsequently from the eventual deposit). Thin film deposits clearly reveal an increase in the number of sub-micron particles when direct ablation ions contribute to the deposition. The possibility for extraction of ablation ions and preparation of ablation plumes of neutrals only has been clearly demonstrated.

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