Thermal wave depth profile of subsurface defect in opaque solids using mirage effect (PDS) [Revisited]

1999 ◽  
Author(s):  
S. Abdalla ◽  
S. Negm ◽  
A. F. Hassan ◽  
H. Talaat
Keyword(s):  
Depth Profile ◽  
Thermal Wave ◽  
Mirage Effect ◽  
Subsurface Defect

Mirage effect spectrometry and light profile microscopy: Two views of an optical depth profile (abstract)

2003 ◽  
Vol 74 (1) ◽  
pp. 536-536
Author(s):  
J. F. Power ◽  
S. W. Fu ◽  
O. V. Nepotchatykh
Keyword(s):  
Optical Depth ◽  
Depth Profile ◽  
Mirage Effect

Thermal wave measurement of ion implanted semiconductors in the mirage effect geometry

1992 ◽  
Vol 61 (5) ◽  
pp. 569-571
Author(s):  
A. L. Glazov ◽  
K. L. Muratikov ◽  
A. V. Suvorov
Keyword(s):  
Thermal Wave ◽  
Mirage Effect ◽  
Wave Measurement ◽  
Thermal Wave Measurement ◽  
Ion Implanted

Thermal‐wave nondestructive evaluation of a carbon‐epoxy composite using mirage effect

1986 ◽  
Vol 59 (1) ◽  
pp. 234-240 ◽  
Author(s):  
L. J. Inglehart ◽  
F. Lepoutre ◽  
F. Charbonnier
Keyword(s):  
Nondestructive Evaluation ◽  
Thermal Wave ◽  
Epoxy Composite ◽  
Mirage Effect

Mirage-effect measurement of thermal diffusivity. Part I: experiment

1986 ◽  
Vol 64 (9) ◽  
pp. 1165-1167 ◽  
Author(s):  
P. K. Kuo ◽  
M. J. Lin ◽  
C. B. Reyes ◽  
L. D. Favro ◽  
R. L. Thomas ◽  
...  
Keyword(s):  
Thermal Diffusivity ◽  
Thermal Wave ◽  
Compound Semiconductor ◽  
Effect Measurement ◽  
Semiconductor Materials ◽  
Wave Method ◽  
Mirage Effect ◽  
Thermal Wave Method ◽  
Thermal Diffusivities

A mirage-effect thermal-wave method for the measurement of thermal diffusivities of solids is described. Data from two different laboratories are provided for various pure elements and compound semiconductor materials. In most cases the agreement with literature values is good.

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