Soft x-ray nanobeam formed by an ellipsoidal mirror

2020 ◽  
Vol 116 (12) ◽  
pp. 121102
Author(s):  
Yoko Takeo ◽  
Akihiro Suzuki ◽  
Hiroto Motoyama ◽  
Yoshinori Takei ◽  
Takehiro Kume ◽  
...  
Keyword(s):  
X Ray ◽  
Author(s):  
Takehiro Kume ◽  
Hirokazu Hashizume ◽  
Kentarou Hiraguri ◽  
Yoichi Imamura ◽  
Hiroaki Miyashita ◽  
...  
Keyword(s):  
X Ray ◽  

1996 ◽  
Vol 437 ◽  
Author(s):  
G.J. Mankey ◽  
K. Subramanian ◽  
R.L. Stockbauer ◽  
R.L. Kurtz

AbstractWe present measurements of the evolution with film thickness of the 3d electronic states at the Fermi energy of ultrathin Ni films. The morphology and thickness of the films is determined from x-ray photoelectron spectroscopy. x-ray photoelectron diffraction and x-ray magnetic linear dichroism using synchrotron radiation. Photoelectron angular distributions were measured using an ellipsoidal mirror analyzer. Even at submonolayer Ni coverages, the 3d electronic states exhibit bulk-like properties. This is attributed to the short screening length of electrons in metals, the localization of the 3d electrons, the similarity of the Ni and Cu ion cores, and finally the interaction with the underlying fcc periodic potential.


2016 ◽  
Vol 29 (4) ◽  
pp. 27-31 ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yoshiki Kohmura ◽  
Kazuto Yamauchi ◽  
...  
Keyword(s):  
X Ray ◽  

2016 ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yoshiki Kohmura ◽  
Kazuto Yamauchi ◽  
...  
Keyword(s):  
X Ray ◽  

2019 ◽  
Vol 114 (24) ◽  
pp. 241102 ◽  
Author(s):  
H. Motoyama ◽  
A. Iwasaki ◽  
Y. Takei ◽  
T. Kume ◽  
S. Egawa ◽  
...  
Keyword(s):  
X Ray ◽  

2019 ◽  
Vol 90 (2) ◽  
pp. 021718 ◽  
Author(s):  
Takehiro Kume ◽  
Yoshinori Takei ◽  
Satoru Egawa ◽  
Hiroto Motoyama ◽  
Yoko Takeo ◽  
...  

1987 ◽  
Author(s):  
Keith W. Jones ◽  
Peter Z. Takacs ◽  
Jerome B. Hastings ◽  
John M. Casstevens ◽  
Christopher D. Pionke
Keyword(s):  
X Ray ◽  

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yoshiki Kohmura ◽  
Kazuto Yamauchi ◽  
...  

2019 ◽  
Vol 26 (5) ◽  
pp. 1406-1411 ◽  
Author(s):  
Hiroto Motoyama ◽  
Shigeki Owada ◽  
Gota Yamaguchi ◽  
Takehiro Kume ◽  
Satoru Egawa ◽  
...  

Intense sub-micrometre focusing of a soft X-ray free-electron laser (FEL) was achieved by using an ellipsoidal mirror with a high numerical aperture. A hybrid focusing system in combination with a Kirkpatrick–Baez mirror was applied for compensation of a small spatial acceptance of the ellipsoidal mirror. With this system, the soft X-ray FEL pulses were focused down to 480 nm × 680 nm with an extremely high intensity of 8.8×1016 W cm−2 at a photon energy of 120 eV, which yielded saturable absorption at the L-edge of Si (99.8 eV) with a drastic increase of transmittance from 8% to 48%.


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