Development of 120-mm-long ellipsoidal mirror for soft x-ray microscopy

2019 ◽  
Author(s):  
Takehiro Kume ◽  
Hirokazu Hashizume ◽  
Kentarou Hiraguri ◽  
Yoichi Imamura ◽  
Hiroaki Miyashita ◽  
...  
Keyword(s):  
X Ray ◽  
Ellipsoidal Mirror

Photoelectron Angular Distributions Of Ultrathin NI/CU(001) Films

1996 ◽  
Vol 437 ◽  
Author(s):  
G.J. Mankey ◽  
K. Subramanian ◽  
R.L. Stockbauer ◽  
R.L. Kurtz
Keyword(s):  
Photoelectron Spectroscopy ◽  
Periodic Potential ◽  
Electronic States ◽  
Linear Dichroism ◽  
Angular Distributions ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Ellipsoidal Mirror ◽  
Magnetic Linear Dichroism ◽  
Photoelectron Angular Distributions

AbstractWe present measurements of the evolution with film thickness of the 3d electronic states at the Fermi energy of ultrathin Ni films. The morphology and thickness of the films is determined from x-ray photoelectron spectroscopy. x-ray photoelectron diffraction and x-ray magnetic linear dichroism using synchrotron radiation. Photoelectron angular distributions were measured using an ellipsoidal mirror analyzer. Even at submonolayer Ni coverages, the 3d electronic states exhibit bulk-like properties. This is attributed to the short screening length of electrons in metals, the localization of the 3d electrons, the similarity of the Ni and Cu ion cores, and finally the interaction with the underlying fcc periodic potential.

Advancement of Hard X-ray Nano-focusing Ellipsoidal Mirror at SPring-8

2016 ◽  
Vol 29 (4) ◽  
pp. 27-31 ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yoshiki Kohmura ◽  
Kazuto Yamauchi ◽  
...  
Keyword(s):  
X Ray ◽  
Ellipsoidal Mirror

scholarly journals X-ray microfocusing with off-axis ellipsoidal mirror

2016 ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yoshiki Kohmura ◽  
Kazuto Yamauchi ◽  
...  
Keyword(s):  
X Ray ◽  
Ellipsoidal Mirror

Broadband nano-focusing of high-order harmonics in soft X-ray region with ellipsoidal mirror

2019 ◽  
Vol 114 (24) ◽  
pp. 241102 ◽  
Author(s):  
H. Motoyama ◽  
A. Iwasaki ◽  
Y. Takei ◽  
T. Kume ◽  
S. Egawa ◽  
...  
Keyword(s):  
High Order ◽  
X Ray ◽  
Ellipsoidal Mirror

Development of electroforming process for soft x-ray ellipsoidal mirror

2019 ◽  
Vol 90 (2) ◽  
pp. 021718 ◽  
Author(s):  
Takehiro Kume ◽  
Yoshinori Takei ◽  
Satoru Egawa ◽  
Hiroto Motoyama ◽  
Yoko Takeo ◽  
...  
Keyword(s):  
X Ray ◽  
Electroforming Process ◽  
Ellipsoidal Mirror

scholarly journals Fabrication Of An 8:1 Ellipsoidal Mirror For A Synchrotron X-Ray Microprobe

1987 ◽  
Author(s):  
Keith W. Jones ◽  
Peter Z. Takacs ◽  
Jerome B. Hastings ◽  
John M. Casstevens ◽  
Christopher D. Pionke
Keyword(s):  
X Ray ◽  
Ellipsoidal Mirror

scholarly journals Ellipsoidal mirror for two-dimensional 100-nm focusing in hard X-ray region

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Hirokatsu Yumoto ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yoshiki Kohmura ◽  
Kazuto Yamauchi ◽  
...  
Keyword(s):  
Two Dimensional ◽  
X Ray ◽  
Ellipsoidal Mirror

scholarly journals Intense sub-micrometre focusing of soft X-ray free-electron laser beyond 1016 W cm−2 with an ellipsoidal mirror

2019 ◽  
Vol 26 (5) ◽  
pp. 1406-1411 ◽  
Author(s):  
Hiroto Motoyama ◽  
Shigeki Owada ◽  
Gota Yamaguchi ◽  
Takehiro Kume ◽  
Satoru Egawa ◽  
...  
Keyword(s):  
Photon Energy ◽  
Free Electron ◽  
High Intensity ◽  
Free Electron Laser ◽  
Numerical Aperture ◽  
Saturable Absorption ◽  
X Ray ◽  
High Numerical Aperture ◽  
Ellipsoidal Mirror ◽  
Drastic Increase

Intense sub-micrometre focusing of a soft X-ray free-electron laser (FEL) was achieved by using an ellipsoidal mirror with a high numerical aperture. A hybrid focusing system in combination with a Kirkpatrick–Baez mirror was applied for compensation of a small spatial acceptance of the ellipsoidal mirror. With this system, the soft X-ray FEL pulses were focused down to 480 nm × 680 nm with an extremely high intensity of 8.8×1016 W cm−2 at a photon energy of 120 eV, which yielded saturable absorption at the L-edge of Si (99.8 eV) with a drastic increase of transmittance from 8% to 48%.

Three-dimensional shape measurement for x-ray ellipsoidal mirror

2017 ◽  
Author(s):  
Takehiro Kume ◽  
Yoshinori Takei ◽  
Satoru Egawa ◽  
Gota Yamaguchi ◽  
Hiroto Motoyama ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Shape Measurement ◽  
X Ray ◽  
Ellipsoidal Mirror ◽  
Dimensional Shape ◽  
Three Dimensional Shape
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