scholarly journals Quantitative electrostatic force measurement and characterization based on oscillation amplitude using atomic force microscopy

AIP Advances ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 015143
Author(s):  
Kesheng Wang ◽  
Yijia Lu ◽  
Jia Cheng ◽  
Xiaoying Zhu ◽  
Linhong Ji
Keyword(s):  
Atomic Force Microscopy ◽  
Force Measurement ◽  
Electrostatic Force ◽  
Oscillation Amplitude ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements

2019 ◽  
Vol 10 ◽  
pp. 617-633 ◽  
Author(s):  
Aaron Mascaro ◽  
Yoichi Miyahara ◽  
Tyler Enright ◽  
Omur E Dagdeviren ◽  
Peter Grütter
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Force ◽  
Oscillation Period ◽  
Electrostatic Force Microscopy ◽  
Time Varying ◽  
Time Resolved ◽  
Battery Materials ◽  
Force Microscopy ◽  
Atomic Force ◽  
Microscopy Techniques

Recently, there have been a number of variations of electrostatic force microscopy (EFM) that allow for the measurement of time-varying forces arising from phenomena such as ion transport in battery materials or charge separation in photovoltaic systems. These forces reveal information about dynamic processes happening over nanometer length scales due to the nanometer-sized probe tips used in atomic force microscopy. Here, we review in detail several time-resolved EFM techniques based on non-contact atomic force microscopy, elaborating on their specific limitations and challenges. We also introduce a new experimental technique that can resolve time-varying signals well below the oscillation period of the cantilever and compare and contrast it with those previously established.

Effect of Tip Size on Force Measurement in Atomic Force Microscopy

Langmuir ◽  
2008 ◽  
Vol 24 (6) ◽  
pp. 2271-2273 ◽  
Author(s):  
Leonard T. W. Lim ◽  
Andrew T. S. Wee ◽  
Sean J. O'Shea
Keyword(s):  
Atomic Force Microscopy ◽  
Force Measurement ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids

2012 ◽  
Vol 3 ◽  
pp. 336-344 ◽  
Author(s):  
Miriam Jaafar ◽  
David Martínez-Martín ◽  
Mariano Cuenca ◽  
John Melcher ◽  
Arvind Raman ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Amplitude Modulation ◽  
Frequency Modulation ◽  
Driving Force ◽  
Oscillation Amplitude ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Modulation Mode ◽  
Feedback Scheme

We introduce drive-amplitude-modulation atomic force microscopy as a dynamic mode with outstanding performance in all environments from vacuum to liquids. As with frequency modulation, the new mode follows a feedback scheme with two nested loops: The first keeps the cantilever oscillation amplitude constant by regulating the driving force, and the second uses the driving force as the feedback variable for topography. Additionally, a phase-locked loop can be used as a parallel feedback allowing separation of the conservative and nonconservative interactions. We describe the basis of this mode and present some examples of its performance in three different environments. Drive-amplutide modulation is a very stable, intuitive and easy to use mode that is free of the feedback instability associated with the noncontact-to-contact transition that occurs in the frequency-modulation mode.

The Study on the Ultrasonic Nanomachining of Au/Ti Thin Film by Atomic Force Microscopy

2014 ◽  
Vol 627 ◽  
pp. 35-39
Author(s):  
Jen Ching Huang ◽  
Ho Chang ◽  
Yong Chin You ◽  
Hui Ti Ling
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Quartz Crystal ◽  
Normal Force ◽  
Force Measurement ◽  
Great Influence ◽  
Measurement Model ◽  
Cutting Depth ◽  
Force Microscopy ◽  
Atomic Force

This study focused on the ultrasonic nanomachining by atomic force microscopy (AFM) to understand the phenomena of the ultrasonic nanomachining. The workpiece is an Au/Ti thin film and coated on the quartz crystal resonator (QCR). The ultrasound vibration of workpiece is carried out by used the Quartz crystal microbalance (QCM). And a normal force measurement model was built by force curve measurements in ultrasound vibration environment. The influence of different experimental parameters can be studied such as normal force and repeat number on the cutting depth and chip stacking. After the experiments, it can be found that the ultrasonic nanomachining by AFM is possessed great influence on the cutting depth.

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